Dynamic light scattering allows for the measurement of particle size and size distribution of nanoparticles dispersed in a liquid without separating the particles. Here, we present examples of particle size measurement for silica and alumina particles in an aqueous medium. Particles in a solution exhibit Brownian motion that depends on their size, and the fluctuations in the scattered light caused by illuminating the particles are also size-dependent. By observing and analyzing these fluctuations, we can determine the particle size and size distribution. [Alumina Measurement Results and Discussion] - As alumina approaches neutrality from a strongly alkaline condition, it nears its isoelectric point. - The surface charge of the particles decreases. - The repulsion between particles diminishes. - It can be inferred that particle aggregation is occurring. [Silica Measurement Results and Discussion] - It is believed that the isoelectric point is on the strongly acidic side. - In the pH range of 3 to 10, particle aggregation does not occur. - Particle size is maintained below 50 nm.

Polyethylene (PE) has several types and different material properties depending on the length and number of its side chain branches. From the melting peak of crystalline polyethylene, we measured the melting point and crystallinity using DSC and compared them for each type of polyethylene. LDPE, which has many long side chains and is less dense, resulted in a low melting point and low crystallinity, while HDPE, which tends to be denser, showed high values for both melting point and crystallinity. Additionally, LLDPE, which has many relatively short side chains and is more likely to be dense than LDPE, exhibited intermediate values for both melting point and crystallinity between LDPE and HDPE. [Types of Polyethylene] ■ LDPE (Low-Density Polyethylene): Low rigidity and high flexibility ■ LLDPE (Linear Low-Density Polyethylene): Tougher than LDPE but has inferior processability ■ HDPE (High-Density Polyethylene): High rigidity and excellent tensile strength, impact strength, and hardness

Liquid crystal displays use various organic materials, including liquid crystals, sealing materials, encapsulants, and polarizers. Considering the material properties and degradation mechanisms of each component from a chemical perspective is important for product evaluation and failure analysis. This document presents examples of chemical analyses for the components of liquid crystal displays. 【Examples of Chemical Analysis】 ■FT-IR: Principal component analysis ■EDX: Elemental analysis ■GCMS: Liquid crystal component analysis ■HS-GCMS: Outgassing analysis (degradation analysis) and others

A seminar will be held on the fields of crystal growth of power semiconductors, fundamental physical property evaluation, process technology, devices, and equipment applications. We will introduce our latest analysis services at the poster session and corporate exhibition booth, so please stop by. Booth: Fukuoka International Conference Center, Fukuoka Sunpalace, 4F, 411 We look forward to your participation.

We will be participating in SEMICON Japan, where companies that color the electronics manufacturing supply chain will exhibit and showcase cutting-edge technologies and trends! We will introduce our services at this large exhibition, which covers manufacturing technologies, equipment, and materials in the semiconductor industry, as well as SMART applications such as vehicles and IoT devices. Please come and see our latest analysis services at our booth. Thank you very much. Booth number: 3531 (East Hall 3) We look forward to your participation.

Aites Co., Ltd. has introduced the KEYENCE manufactured one-shot 3D shape measurement device 'VR-6200'. It comes with an electric rotation unit, allowing for the reproduction of cross-sectional shapes without cutting. The HDR scanning algorithm enables measurement of glossy surfaces as well. This single device can perform various measurements, including profile measurement, flatness measurement, volume area, and comparative measurement. For more details, please refer to the related products and catalog.

We will participate in the commercial exhibition program at the 42nd Nano Testing Symposium, which will be held in November 2022. This symposium brings together researchers in the fields of design, process, testing, and design/manufacturing/testing equipment. We will also be showcasing our latest analytical technology services, so please stop by. Booth: Senri Room (6F) No.1 [Immediately to the right upon entering, in front of the monitor] We look forward to your participation.

Introducing our Raman spectrum acquisition service for rock samples. If you send us thin-sectioned rock specimens or extracted minerals and specify the measurement locations, we will obtain the Raman spectra for the specified areas. We also offer thin-sectioning, elemental analysis (EDX, EPMA), and EBSD analysis services. Please feel free to contact us when you need our services. 【Features】 - Raman spectra are very effective for identifying and analyzing mineral species in rocks. - If you send us thin-sectioned rock specimens or extracted minerals and specify the measurement locations, we will obtain the Raman spectra for the specified areas. - We also offer thin-sectioning, elemental analysis (EDX, EPMA), and EBSD analysis services. More detailed information is available in related products and catalogs.

We would like to inform you that we have moved from our previous headquarters in Yasu and our Ritto office to the following new location. Taking this opportunity, we are committed to further developing our business and making every effort to meet your expectations. We kindly ask for your continued support and goodwill. 【New Headquarters Location】 ■ Address: 1-60 Kuribayashi-cho, Otsu City, Shiga Prefecture ■ Phone: 077-599-5015 ■ FAX: 077-544-7710 * The phone numbers for each department remain the same as before. Operations, phone, and fax services at the old location have been discontinued as of August 10 (Wednesday). We apologize for any inconvenience this may cause and appreciate your understanding.

"Laminating film" is used in various industries for the purpose of protecting the display surface while maintaining the visibility of printed materials by utilizing highly transparent materials. During processing, heat bonding is performed, so it is assumed that the molecular state changes compared to before processing. In this study, we attempted to clarify the residual stress remaining in the product by comparing conditions with and without heat applied to the laminating film, using birefringence. This document presents measurement results using a laminating film composed of polyethylene terephthalate (PET) and ethylene-vinyl acetate (EVA) as an example. [Contents] ■ Measurement of glass transition temperature by DSC ■ Measurement of birefringence by WPA ■ Effects of combining PET and EVA You can view related products and catalogs.

The introduction of the "FIB-SEM Helios 5 UC" is scheduled to start service in November. We will provide shorter delivery times and reliable feedback than before. We will achieve high-throughput cross-sectional observation and analysis of a wide range of materials, from semiconductor devices such as power devices, ICs, solar cells, and light-emitting elements to electronic components like MLCCs and soft materials. With a high-quality beam of up to 100nA, we can process large areas at high speed, and by finishing the FIB at low acceleration, it is possible to produce high-quality samples with minimal damage layers. You can view related products and catalogs.

We will participate in the commercial session and commercial exhibition program at the 40th Nano Testing Symposium, which will be held in November 2020. This symposium brings together researchers in the fields of design, process, testing, and design/manufacturing/testing equipment. We will also introduce our latest analytical technology services, so please stop by. Booth: KFC Hall Annex (3F) No.3 [on the right side upon entry] We look forward to your participation.

A seminar will be held on topics related to crystal growth of power semiconductors, fundamental property evaluation, process technology, devices, and equipment applications. We will also introduce our latest analysis services at the poster session and company exhibition booth, so please feel free to stop by. Booth: Large Conference Room Dahlia E07 We look forward to your participation.