Dynamic SIMS

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"Dynamic SIMS" is a secondary ion mass spectrometry method that can detect trace amounts of all elements (from H to U) in samples with high sensitivity, ranging from ppm to ppb. It allows for qualitative analysis and depth profiling, and additionally enables high-precision quantitative analysis using standard samples (conducted at our partner company's facility). The minimum beam diameter is approximately 30 µm, and it can be further reduced depending on the material.

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Dynamic SIMS
Suitable for analysis of glass, metal, ceramics, silicon, compound semiconductors, shallow implants, and more!

For more details, please refer to the PDF document or feel free to contact us.
Surface analysis using TOF-SIMS.
TOF-SIMS can analyze light elements and inorganic substances as well as large organic molecules.

TOF-SIMS irradiates pulsed primary ions and performs mass analysis based on the flight time of the excited emitted ions. Ions with larger mass take longer to reach the detector, allowing for mass separation.
TOF-SIMS analysis of organic matter
As an example of organic matter analysis, I would like to introduce a case where polyethylene glycol was analyzed.

For more details, please refer to the PDF document or feel free to contact us.
TOF-SIMS analysis of trace contaminants
The analysis sensitivity of TOF-SIMS is high at the ppm level, making it effective for analyzing trace contamination!

For more details, please refer to the PDF document or feel free to contact us.
[Example of TOF-SIMS] Analysis of Li
It is possible to detect with high sensitivity! We will introduce a case comparing the analysis of Li using TOF-SIMS and SEM-EDX.

For more details, please refer to the PDF document or feel free to contact us.
Composition analysis of raw materials for all-solid-state batteries.
The purity of the electrolyte greatly affects the performance of the battery! It suppresses the volatility of sulfur components and converts them into a form that can be detected by IC.

For more details, please refer to the PDF document or feel free to contact us.