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Surface analysis using TOF-SIMS.

TOF-SIMS can analyze light elements and inorganic substances as well as large organic molecules.

■TOF-SIMS Three Analysis Modes - High-resolution mass spectrum - Depth profile analysis - Surface mapping analysis

Analysis of surface contamination and surfactant residues using TOF-SIMS.

basic information

TOF-SIMS irradiates pulsed primary ions and performs mass analysis based on the flight time of the excited emitted ions. Ions with larger mass take longer to reach the detector, allowing for mass separation.

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Applications/Examples of results

- Molecular structure of phthalocyanine green in green pigments - Depth direction analysis of thin film a-Si solar cells - Surface analysis of Si wafer contamination

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Total Quality Technology Solutions

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Analysis of microscopic foreign substances using imaging FT-IR.

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Sampling techniques for micro foreign object analysis

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[Data] Case Study of Low Molecular Weight Organic Acid Analysis by Ion Chromatography

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The Flow of Chemical Analysis

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[Data] FT-IR Analysis of Transparent Resin

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[Data] IR Analysis of Vinyl Polymers (Resin Materials)

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[Information] We will solve the cause of the issue from a chemical perspective.

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[Example of TOF-SIMS] Analysis of Li

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[Example of TOF-SIMS] Wide-area image map

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Chemical Analysis Trust Service

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.