Surface and chemical analysis
Surface and chemical analysis
At Aites, we conduct surface, foreign matter, and contamination analysis.
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Analysis of microscopic foreign substances using imaging FT-IR.
If it is 5 micrometers or larger, foreign object IR data can be obtained.
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Sampling techniques for the analysis of microscopic foreign substances
We will report rapid analysis results using various sampling techniques regarding foreign substances that significantly impact the yield of electronics products.
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Total support service for chemical analysis
We conduct surface analysis, foreign substance analysis, and organic composition analysis.
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Component Analysis: GC-MS Gas Chromatography Mass Spectrometer
Introducing a new device! We present an analytical method aimed at the qualitative and quantitative analysis of components contained in samples.
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[Information] Liquid Crystal Materials and Their Analytical Techniques
Easily explain the technical capabilities of Aites by analyzing molecular structures with diagrams and tables!
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DMA (Dynamic Mechanical Analysis)
We offer a variety of measurement modes, including double cantilever beam bending and three-point bending with free support!
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DSC (Differential Scanning Calorimetry)
Observe the degree of endothermic/exothermic reaction of the sample! The temperature range is possible from -90°C to 550°C.
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TG-DTA (Thermogravimetric Differential Thermal Analysis)
Output the temperature difference between the sample and the reference material as a DTA signal! Change the temperature according to a constant program.
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TMA (Thermomechanical Analysis)
Information on thermal expansion, thermal contraction, and glass transition temperature can be obtained in multiple measurement modes!
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TOF-SIMS analysis of organic matter
As an example of organic matter analysis, I would like to introduce a case where polyethylene glycol was analyzed.
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TOF-SIMS analysis of trace contaminants
The analysis sensitivity of TOF-SIMS is high at the ppm level, making it effective for analyzing trace contamination!
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AFM (Atomic Force Microscope)
High-resolution imaging with a micro probe! Achieving nano-level structural analysis.
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Analysis of crystallinity in resin materials using micro-Raman spectroscopy.
By using micro-Raman, it is possible to evaluate the crystallinity in a fine range (1μm and above)!
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GCMS analysis of liquid crystal components
Comparison of components in liquid crystal panels using gas chromatography-mass spectrometry (GC-MS) is published!
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Analysis of multilayer materials using micro-Raman.
Depth-direction measurements using Raman spectroscopy! Material analysis of each layer is possible from the surface of multilayer films.
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Depth profiling analysis of thin film layers using XPS angle-resolved method.
Non-destructive depth analysis of thin films on the nm order is possible! We will also introduce analysis examples.
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Surface analysis using TOF-SIMS.
TOF-SIMS can analyze light elements and inorganic substances as well as large organic molecules.
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[Data] Research Institute of Chemical Reaction Mechanisms - Case Study on the Causes of Material Discoloration
Clear publication of analysis results using polyamide imide materials and IR devices, as well as data analysis!
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Attention those struggling with material properties in the manufacturing process at the Institute of Chemical Reaction Mechanisms!
What is the reason for this discoloration on the surface? Why are there cracks in such places? These issues will be resolved from the perspectives of electrons, atoms, molecules, and chemical reaction mechanisms!
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Analysis of metal corrosion using micro-Raman spectroscopy.
Analysis of inorganic compounds such as metal oxides is also possible!
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Analysis of inorganic compounds using micro-Raman spectroscopy.
Analysis of inorganic compounds such as metal oxides is also possible! We will introduce the analysis of black spots on the surface of copper-clad laminates.
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[Data] Research Institute of Chemical Reaction Mechanisms, Delamination Mechanism of Heterogeneous Material Interfaces 1
We will introduce a case that elucidates the differences in linear expansion coefficients of PET and PEN films with similar main skeletal structures and the mechanisms that produce these differences.
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Analysis case of low molecular organic acids by ion chromatography.
Detection of certain organic substances is possible! Here is an example of measuring low molecular weight organic acids in an anion exchange mode.
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Measurement of resin curing degree using FT-IR.
It is possible to monitor the progress of the adhesive curing reaction (degree of curing)!
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Liquid foreign substance sampling technique for FT-IR analysis
Sampling using capillaries through surface tension! FT-IR analysis has become possible.
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Ion chromatography analysis
Solid samples can leach ionic components into pure water! Trace ionic components in the aqueous solution can be detected with high sensitivity.
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Analysis of difficult-to-detect substances by reaction thermal decomposition GC-MS.
By adding a special reagent to the sample and heating it, it becomes possible to detect substances that are usually difficult to detect!
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Analysis of Organic Multilayer Films by Imaging FT-IR: Aluminum
Introducing a method for analyzing near the surface through total internal reflection of infrared light by closely adhering micro ATR crystals!
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[Data] Example of load unloading mode and color filter measurement using an ultra-micro hardness tester.
Examples of hardness measurement for color filters and results obtained from hardness measurements using graphs are provided.
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Analysis of Organic Multilayer Films Using Imaging FT-IR
It is possible to investigate the layer structure of organic films! Introducing imaging FT-IR analysis of high-performance multilayer film cross-sections.
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