Analysis of microscopic foreign substances using imaging FT-IR.
If it is 5 micrometers or larger, foreign object IR data can be obtained.
■Service Overview 1. Micro ATR Method IR data acquisition of foreign substances is possible if they are approximately 5um or larger. 2. Surface Distribution Image Observation of the in-plane distribution of organic substances is possible. 3. Temporal Changes Measurement of the state of organic substances that change on a second-by-second basis is possible.
basic information
■Features 1. Measurement Method Data collection using imaging, with spectral display at the pixel level 2. Measurement Area Transmission/Reflection method 175um, ATR method 35um 3. Spatial Resolution (Pixel Size) Transmission/Reflection method 5.5um, ATR method 1.1um
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Applications/Examples of results
Analysis of lubricant on polyethylene film
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Micro FT-IR imaging measurement
We would like to introduce the "Microscopic FT-IR Imaging Measurement" that we conduct. It allows for the visualization of the distribution of substances as a two-dimensional image within a specified plane. It becomes possible to evaluate changes in the distribution of substances that are difficult to assess with regular point measurements through visual images.
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Chemical Analysis Concierge Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.