Analysis of Organic Multilayer Films by Imaging FT-IR: Aluminum
Introducing a method for analyzing near the surface through total internal reflection of infrared light by closely adhering micro ATR crystals!
Based on imaging obtained from FT-IR spectra using the ATR method, cross-sectional analysis of organic multilayer films such as aluminum laminate film can be performed. The ATR method (Attenuated Total Reflection) is a technique that involves closely adhering a micro ATR crystal to the sample, allowing for analysis near the surface through total internal reflection of infrared light. Due to the influence of the refractive index of the crystal applied to the sample, the apparent spatial resolution is enhanced, enabling the analysis of smaller foreign substances. 【Features of the ATR Method】 ■ A technique that analyzes near the surface through total internal reflection of infrared light ■ Enhanced apparent spatial resolution due to the influence of the refractive index of the crystal applied to the sample ■ Enables the analysis of smaller foreign substances *For more details, please refer to the PDF document or feel free to contact us.
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