Liquid foreign substance sampling technique for FT-IR analysis
Sampling using capillaries through surface tension! FT-IR analysis has become possible.
Traditionally, sampling of liquid foreign substances has been considered very difficult. In the liquid foreign substance sampling technique for FT-IR analysis, sampling is performed using a capillary and surface tension, making FT-IR analysis possible. 【Sampling Procedure】 ■ Liquid foreign substances on the substrate ■ Sampling with a capillary ■ Transferring the liquid onto a Si wafer for FT-IR analysis ■ Sampling in progress with the capillary ■ Transferring to the Si wafer *For more details, please refer to the PDF document or feel free to contact us.
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Example of liquid sample analysis (sebum) ■FT-IR spectrum of sebum analyzed on a Si wafer after liquid sampling *For more details, please refer to the PDF document or feel free to contact us.*
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For more details, please refer to the PDF document or feel free to contact us.
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Introduction to Micro FT-IR
At Aites Co., Ltd., we have newly introduced "Microscopic FT-IR" this fiscal year. The "Microscopic FT-IR," which combines FT-IR and optical microscopy, allows for the measurement of tiny substances on the order of several tens of micrometers, which are difficult to measure with conventional FT-IR, using an aperture (field of view diaphragm). There are three main measurement methods for Microscopic FT-IR: "transmission method," "reflection method," and "ATR method." While the transmission method is the basic measurement method in Microscopic FT-IR measurements, the reflection method or ATR method may be more suitable depending on the shape of the sample and the feasibility of sampling.
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Chemical Analysis Concierge Service
We would like to introduce our "Chemical Analysis - Trust Us Service." When conducting component analysis of foreign substances or stains on products, it can be challenging to determine whether organic analysis or inorganic analysis is more suitable, and which specific analysis within organic or inorganic is the most appropriate. We provide a comprehensive service for customers who are struggling with the selection of analysis methods. Since each analysis device can measure different targets, it is necessary to choose a method that fits the purpose based on the information available.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.