Announcement of a free webinar: "What is the key to visualizing manufacturing processes?!" - A highly popular seminar where sales engineers share their on-site experiences (7/20, 7/27, 8/3, 8/10). | Kistler Japan G.K.

Announcement of a free webinar: "What is the key to visualizing manufacturing processes?!" - A highly popular seminar where sales engineers share their on-site experiences (7/20, 7/27, 8/3, 8/10).

Kistler Japan G.K. Head office

How to connect the visualization of manufacturing processes to solutions such as quality improvement and defect reduction, finding clues for improvement from collected data, and the factors that hinder success at the stage of utilizing improvements, as well as methods for effective data utilization that remove these hindrances quickly, will be discussed by our sales engineers who have consulted with many manufacturing sites. They will introduce the key points of utilizing in-process load measurement data while unraveling a case study of pin insertion (terminal press fitting), one of the assembly processes for electronic devices. This webinar will be held four times on the following dates, but the content will be the same for all sessions, so please join us on a date that is convenient for you! July 20, 2022 (Wednesday) July 27, 2022 (Wednesday) August 3, 2022 (Wednesday) August 10, 2022 (Wednesday) Please check the details and register using the registration form. https://kistler.webex.com/webappng/sites/kistler/webinar/webinarSeries/register/8625d07fad0b4a7b9730a5db0023d677 We look forward to many participants joining us.

Date and time
Capital
Entry fee

Related product information

Manufacturing Process Monitoring System maXYmos TL 5877B
Anomaly detection in various processes. For example, by attaching a force sensor to the pressing machine, it can detect not only missing parts but even burrs on the side being pressed!

The maXYmos TL consists of two main modules. The "Measurement and Evaluation Module (MEM)" collects sensor signals and performs monitoring based on their waveforms, and the "Display Module (DIM)" has a touch panel for displaying waveforms and setting criteria (thresholds). The Display Module (DIM) can connect up to eight Measurement and Evaluation Modules (MEM). For example, it can flexibly accommodate a simple system using one Measurement and Evaluation Module (MEM) and one Display Module (DIM) to monitor a single pressing process based on the relationship between force and displacement, or a more complex system using multiple Measurement and Evaluation Modules (MEM) to simultaneously monitor a composite assembly process. Additionally, the maXYmos TL includes evaluation criteria (thresholds) that utilize slope, inflection points, hysteresis, and averages, in addition to those available in the lower model, the maXYmos BL (Basic Level) model 5867B..., enabling advanced monitoring of manufacturing processes.
High-Performance Monitoring System for Manufacturing Process maXYmos NC 5847A
Real-time monitoring and control of individual manufacturing steps, assembly units, and the quality of finished products is possible!

maXYmos NC not only evaluates and digitizes the characteristics of waveforms but also controls the servo amplifier that drives the servo press. Communication is conducted in real-time via SERCOS III, which guarantees high reproducibility and optimal performance. It can be easily operated from a PC or a touch screen (optional), and supports various fieldbus interfaces. The built-in sequence control function (sequencer) helps to easily, quickly, and universally map complex operational processes. The display module (DIM) can connect up to eight measurement and evaluation modules (MEM). This allows for flexible solutions, ranging from a simple system that monitors a single pressing process based on the relationship between force and displacement, to systems that use multiple measurement and evaluation modules (MEM) to simultaneously monitor complex assembly processes. Furthermore, high-performance evaluation commands enable monitoring and control even for very complex XY sequences.