Invitation to Exhibit at the Semiconductor and Sensor Packaging Exhibition (Nepcon Japan)

マーポス

Our company will be exhibiting at the "Semiconductor and Sensor Packaging Exhibition (Nepcon Japan)" held at Tokyo Big Sight starting January 24, 2024 (Wednesday). (Booth number: E31-15) At this exhibition, we will introduce applications specifically designed for the semiconductor industry and non-contact measuring instruments that contribute to the reliability of the ever-evolving semiconductor manufacturing processes and the improvement of semiconductor performance. We cordially invite you to visit our booth and take a look. Exhibited products: - Non-contact thickness measurement gauge (interferometry technology) - Non-contact distance/thickness/thin film thickness measuring instrument (chromatic confocal technology) Please register for an admission badge via the URL below, and print it in color in advance before coming to the venue.* https://www.nepconjapan.jp/tokyo/ja-jp/register.html?code=0916133079345892-04F *Admission is by "pre-registration only."

Date and time Wednesday, Jan 24, 2024 ～ Friday, Jan 26, 2024
10:00 AM ～ 05:00 PM
Capital Tokyo Big Sight (East Exhibition Hall)
Entry fee Free Please register in advance by clicking the [Details / Application] button and print out your admission badge to bring with you.

Related product information

Optical Interference Measuring Instrument 'NCG'
Shorten cycle time! A versatile and easy-to-use optical interference measuring instrument designed for convenience.

【Other Features】 ■ Designed for versatility and ease of use ■ Each individual unit controlled by the machine can be connected through a network of sensors ■ Unique technology allows for the measurement of various components (highly reflective, rough surfaces, opaque materials, etc.) ■ Improved electronics unit enables the storage of continuous data during measurements, which can be used for post-process measurement details, quality control, and machine performance evaluation *For more details, please refer to the PDF document or feel free to contact us.
Chromatic confocal technology, non-contact measurement for thickness measurement.
It is possible to produce high-quality work without damaging delicate work and without destructive testing. It is a fully synchronized system that is resilient to variations in work and environment.

【Catalog Contents】 ■ Chromatic Confocal Principle ■ ChromaPoint Sensor Head ■ ChromaPoint Controller ■ ChromaLine Sensor Head ■ ChromaLine Controller ■ ChromaVision Camera ■ Application Examples (Various Distance, Thickness Measurement, Surface Roughness Measurement, Quality Control) ■ Glossary ■ Contact Us *For more details, please refer to the PDF document or feel free to contact us.

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