[Analysis Case] Corrosive Gas Analysis by TDS

You can check for gases that have a negative impact on the product.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Interstitial Carbon in Si Substrate Using Low-Temperature PL and SIMS Analysis

It is possible to confirm the trace amounts of carbon contained in the Si substrate.

last updated Mar 13, 2025

[Analysis Case] Elemental Analysis of Wire Bonding Interface

By using a combination of processing, elemental analysis of the interface is possible.

last updated Mar 13, 2025

[Analysis Case] Analysis of the adhesive sheet components of the wafer

Evaluation of organic pollution's qualitative, quantitative, and distribution aspects using a combination of multiple methods.

last updated Mar 13, 2025

[Analysis Case] De-gassing Analysis of Hydrogen Terminal Wafers

The hydrogen in the outermost single atomic layer can be evaluated using TDS.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Si-based IGBT Chip Cross-section by Low-Temperature Micro Photoluminescence Analysis

It is possible to confirm the influence of the lifetime killer from the cross-sectional direction.

last updated Mar 13, 2025

The influence of adsorbed oxygen in XPS.

XPS: X-ray Photoelectron Spectroscopy

last updated Mar 12, 2025

[Analysis Case] Evaluation of the Skin Permeability of Melbromin

Information about valence bands and intra-gap levels can be obtained by element.

last updated Mar 14, 2025

[Analysis Case] Evaluation of Band Structure by X-ray Absorption and Emission Spectroscopy

Detailed information about the valence band, conduction band, and gap states of the material can be obtained.

last updated Mar 13, 2025

Regarding interface and depth direction resolution

SIMS: Secondary Ion Mass Spectrometry

last updated Mar 12, 2025

Evaluation methods for organic compounds in clean rooms

GC/MS: Gas Chromatography-Mass Spectrometry

last updated Mar 12, 2025

[Analysis Case] Stress Evaluation by Raman Mapping

It is possible to confirm the stress distribution in the sample cross-section.

last updated Mar 13, 2025

[Analysis Case] Valence Evaluation of Trace Metals in Ceramic Materials

It is possible to evaluate trace metals in ppm orders.

last updated Mar 13, 2025

AFM Data Collection

AFM: Atomic Force Microscopy Method

last updated Mar 12, 2025

[Analysis Case] Evaluation of Composition Distribution of Ultra-Thin Films Using Angle-Resolved XPS (ARXPS)

It is possible to evaluate the depth profile of ultra-thin films on the substrate.

last updated Mar 13, 2025

[Analysis Case] Damage Assessment of Single Crystal Si Surface

Quantitative analysis of c-Si and a-Si by state is possible using high-resolution measurement and waveform analysis.

last updated Mar 14, 2025

[Analysis Case] STEM/EDX and Image Simulation for Crystal Structure Evaluation

The evaluation of the crystal structure can be performed based on the STEM images and the results of atomic composition measurements.

last updated Mar 13, 2025

[Analysis Case] Structural Analysis of Amorphous SiNx Films Using Molecular Dynamics Calculations

Microscopic structural analysis of amorphous films is possible through simulation.

last updated Mar 13, 2025

[Analysis Case] Structural Analysis of DRAM Chips using TEM and SEM

Reverse engineering of DRAM on the product's internal substrate.

last updated Mar 13, 2025

[Analysis Case] Comparison of Secondary Electron Images of Cu Surface Using SEM and SIM

It is effective to differentiate between the two methods depending on the surface structure of interest.

last updated Mar 13, 2025

[Analysis Case] Observation of Crystal Grains on Cu Surface Using Scanning Ion Microscopy

It is possible to obtain insights into the size and distribution of crystal grains in metallic polycrystals.

last updated Mar 13, 2025

[Analysis Case] Quantitative Analysis of Low Molecular Weight Siloxanes

We will quantify the siloxanes in the exhaust gas at the ng level.

last updated Mar 13, 2025

[Analysis Case] Evaluation of Oxidation State of Cu Surface by XPS

Separation of components in the Cu spectrum, quantification, and calculation of film thickness.

last updated Mar 13, 2025

[Analysis Case] Simulation of Bending Deformation of Carbon Nanotubes

It is possible to evaluate the shape change and strain energy when external forces are applied to nanomaterials.

last updated Mar 13, 2025

[Analysis Case] Component Analysis of Water Repellent Areas

TOF-SIMS enables wide-area imaging evaluation of multiple components.

last updated Mar 13, 2025

Case studies related to EV (Electric Vehicle) analysis

Analyze the EVolution of EV development!

last updated Jun 06, 2024

[Analysis Case] Evaluation of Carrier Lifetime through Photoluminescence Lifetime Measurement

Insights into the carrier lifetime of SiC can be obtained from the luminous lifetime.

last updated Mar 13, 2025

[Analysis Case] Solder Wetting Test for Semiconductor Packages

It is possible to conduct solder wetting tests on electrodes after accelerated degradation testing.

last updated Mar 13, 2025

Reproducibility of SIMS analysis data

It is possible to evaluate the amount of impurities with high reproducibility.

last updated Apr 18, 2024

Structural analysis using Xe-plasma FIB.

Precision processing/structural evaluation is possible over a wide area of several hundred micrometers.

last updated Mar 12, 2025