[Analysis Case] Measurement of Partial Density of States of GaN

Information about valence bands and gap states can be obtained by element.

last updated Mar 13, 2025

[Analysis Case] STEM, EBSD Image Simulation for Polycrystalline Structure Analysis

Evaluation of crystal forms using simulations.

last updated Mar 13, 2025

[Analysis Case] Analysis of α-Alumina (α-Al2O3) by TDS

Thermal desorption gas analysis of ceramics

last updated Mar 13, 2025

[Analysis Case] Simulation of Impurity Diffusion in Silicon Crystals

It is possible to determine the diffusion pathways and barriers through simulation.

last updated Mar 13, 2025

[Analysis Case] Mechanical Property Evaluation Simulation Using Molecular Dynamics Calculations

It is possible to analyze the deformation behavior of nanomaterials in response to environmental changes (pressure and temperature).

last updated Mar 27, 2025

[Analysis Case] Depth Direction Analysis of Components in SiON Ultra-Thin Films

It is possible to capture molecular information of inorganic substances in the depth direction using TOF-SIMS.

last updated Apr 17, 2025

[Analysis Case] Simultaneous Qualitative Analysis of Inorganic and Organic Contaminants/Adhesives on Wafers

Simultaneous measurement of inorganic and organic components in minute specific areas.

last updated May 19, 2025

[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device

Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.

last updated Jul 18, 2025

[Analysis Case] Composition Analysis of Particles on a Wafer

Shape observation and simple quantitative analysis using SEM-EDX.

last updated Aug 26, 2025

[Analysis Case] Evaluation of Composition Distribution of Ultrathin Films by ARXPS (C0550)

It is possible to evaluate the depth profile of ultra-thin films on the substrate!

last updated Sep 25, 2025

[Analysis Case] Theoretical Calculation of Fe/MgO/Fe Junction System (C0583)

Investigation of TMR ratio and the behavior of spin and charge in the Fe/MgO/Fe junction system using first-principles calculations with the NEGF method!

last updated Sep 25, 2025

[Analysis Case] SEM Observation of Wide-Area Cross-Section Using Xe-PFIB

Observation of cross-sections with an accuracy of several tens of nanometers and a size of several hundred micrometers is possible!

last updated Sep 25, 2025

[Analysis Case] Evaluation of DC Voltage Dependence of Carriers in Semiconductors

We will introduce an analysis case using Si samples with known carrier concentration!

last updated Oct 03, 2025

[Analysis Case] Precursor Adsorption Simulation in ALD Film Formation

Information on the activation energy and reaction heat during precursor adsorption on the substrate can be obtained!

last updated Sep 30, 2025

[Analysis Case] HF Etching Simulation of a-SiO2 Film

Effective for understanding surface reactions at the atomic level in the etching process.

last updated Oct 24, 2025

[Analysis Case] Vapor Pressure Calculation of Ga-containing Precursor by Molecular Dynamics Simulation

Effective for predicting the vapor pressure of metal complexes used as precursors in ALD and CVD!

last updated Oct 24, 2025

[Analysis Case] Contamination Analysis in Vacuum Equipment

It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!

last updated Oct 24, 2025