ARCTIC SPM Lab

New type low-temperature scanning probe microscope

last updated Jul 14, 2025

DA20 Analyser

Compact angle-resolved photoelectron spectroscopy analyzer

last updated Jul 04, 2025

HAXPES Lab system

A window to the bulk" , "Beam time at your fingertips

last updated Dec 17, 2020

High-resolution XPS/UPS/ARPES

The compact analyzer DA-20 with high-resolution XPS/UPS/ARPES has been newly released!

last updated Jan 15, 2020

Leave surface analysis to us for basic researchers!

Photoelectron spectroscopy-related devices - Introducing an outstanding range of products such as scanning tunneling microscopes (STM) and atomic force microscopes (AFM) utilizing ultra-high vacuum technology!

last updated Jan 10, 2020

Low-Energy Electron Diffraction Device 'LEED'

An electron gun with a diameter of 10mm obtains a LEED pattern image while minimizing the shadow area.

last updated Aug 31, 2018

VUV-5K (Ultraviolet Light Source)

Introduction to Vacuum Ultraviolet Light Sources

last updated Jul 19, 2018

DA30-L (Photoelectron Analyzer)

Introduction to ARPES Analysis Analyzer

last updated Jul 19, 2018

ARPES-Lab (Angle-Resolved Photoemission Spectroscopy Analysis System)

Introduction of a next-generation ARPES measurement device for XPS observation and measurement with angle-resolved ARPES!

last updated Jul 04, 2025

VT-STM/AFM (Variable Temperature Scanning Tunneling Microscope)

This is an introduction to a scanning tunneling microscope equipped with a cooling and heating system.

last updated Jul 19, 2018

Cluster Systems (Vacuum Deposition Equipment)

This is an introduction to the vacuum deposition device.

last updated Jul 19, 2018

Custom MBE Systems (Vacuum Deposition Equipment)

This is an introduction to the vacuum deposition device.

last updated Jul 19, 2018

HAXPES-Lab (Laboratory-type Hard X-ray Photoelectron Spectroscopy Analysis System)

Hard X-ray photoelectron spectroscopy, which was only possible at synchrotron facilities, is now available for use in laboratories!

last updated Jul 19, 2018

HiPP-Lab (Environmentally Controlled X-ray Photoelectron Spectroscopy Analysis System)

XPS analysis equipment that enables measurements at atmospheric pressure levels!

last updated Jul 19, 2018

LT STM (Low Temperature Scanning Tunneling Microscope)

Introduction to Scanning Tunneling Microscopy in Ultra-Low Temperature Environments

last updated Jul 19, 2018

HYDROGEN ATOM BEAM SOURCE HABS

This is product information for the Hydrogen Atom Beam Source (HABS).

last updated Jan 10, 2020

CARBON SUBLIMATION SOURCE SUKO

This is product information for the CARBON SUBLIMATION SOURCE SUKO.

last updated Jan 10, 2020

SILICON SUBLIMATION SOURCE SUSI

This is product information for the SILICON SUBLIMATION SOURCE SUSI.

last updated Jan 10, 2020

COMPACT EFFUSION CELLS

This is the product information for COMPACT EFFUSION CELLS.

last updated Jan 10, 2020

Oxygen Atom Beam Source OBS

This is the product information for the Oxygen Atom Beam Source (OBS).

last updated Jan 10, 2020

Sienta Omicron Excitation Source

We have various types of excitation sources available.

last updated Jan 10, 2020

Sienta Omicron Vapor Deposition Source

We have various types of deposition sources available.

last updated Jan 10, 2020

Sienta Omicron Composite Analysis Device

We offer a variety of types of hybrid analytical instruments.

last updated Jan 10, 2020

Sienta Omicron SPM (Scanning Probe Microscope) Ultra High Vacuum Exhaust System

We offer various ultra-high vacuum pumping systems for scanning probe microscopes.

last updated Jan 10, 2020

Sienta Omicron SPM (Scanning Probe Microscope) Accessories

We offer a variety of accessories for scanning probe microscopes.

last updated Jan 10, 2020

Sienta Omicron Scanning Probe Microscope

We offer a wide variety of microscopes tailored to meet our customers' needs.

last updated Jan 10, 2020

Sienta Omicron Surface Analysis Device ESCA

X-ray photoelectron spectroscopy device

last updated Sep 12, 2018