NS Technologies Tri-Temp IC Handler NS-8080MT
The layout and operability of the NS series remain unchanged, achieving stable low-temperature measurements.
NS Technologies NS8080MT is a tri-temp handler that supports device measurements at low, high, and room temperatures. It employs a cooling system that does not require liquid nitrogen, achieving low running costs and stable operation.
basic information
【Main Specifications】 Target PKG: QFP, BGA, CSP, LGA, QFN, PGA, PLCC, TSOP, etc. *JEDEC tray-loaded devices Simultaneous measurement count: 8 units UPH: Cold: 6400 Hot: 7400 Amb: 8875 Measurement temperature: -55 to 130℃ ±3℃ (~175℃/OP) Classification count: 6 classifications (Automatic: 3 classifications Manual: 3 classifications) Options: Device rotation mechanism, 2D ID reader, QR reader, socket remaining device detection, device lift detection, etc.
Price range
Delivery Time
Model number/Brand name
NS-8080MT
Applications/Examples of results
NS Technologies' IC test handlers are used for testing a wide variety of semiconductor devices. Microcontrollers (MCUs): Semiconductors that control home appliances, automobiles, and industrial equipment, contributing to the assurance of their complex functions and reliability. SoC (System-on-a-Chip): Semiconductors that integrate multiple functions into a single chip, serving as the heart of devices like smartphones. They address the demands of multifunctionality and complex testing requirements. Power Semiconductors: Semiconductors that perform power conversion and control in electric vehicles (EVs) and industrial equipment, used for evaluating characteristics that handle high voltage and large current. RF Devices (Radio Frequency Devices): Semiconductors used for wireless communication in smartphones and Wi-Fi devices. They require a high-precision testing environment to handle high-frequency signals. In this way, NS Technologies' handlers play a crucial role in supporting the quality and performance of many electronic devices around us.
