Power device "KGD"
Full testing at low cost! The sealed structure of the probe ensures the safety and reliability of the press.
Our "KGD" is a testing device that performs 4Site parallel testing, capable of conducting static and dynamic tests at both room temperature and high temperature. The UPH is high, ranging from 1000 to 1200, with high testing efficiency, significantly reducing testing costs. It also supports various LD/ULD boxes. The sealed structure of the probe ensures the safety and reliability of the inspection. 【Features】 ■ Compatible with various LD/ULD boxes ■ Temperature range RT-200°C (optional -45°C) ■ Supports 3000V/1200A ■ Capable of full testing with 4Site parallel testing and static + dynamic tests ■ Specially designed circuits guarantee circuit inductance of less than 15nH *For more details, please refer to the PDF document or feel free to contact us.
basic information
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