High Voltage Semiconductor Pulse Generation Unit
Generates sharp edges of ±40V / 1000V/μs, compatible with NVM, MEMS, and mid-power device testing! PXIe-compatible high-voltage pulse source unit.
It is a single-channel high-voltage semiconductor pulse generation unit that can output adjustable high-precision, high-voltage pulse signals. - High Voltage Range It supports an output of ±40V, meeting the technical conditions for NVM (non-volatile memory) testing. - High Voltage with Fast Slew Rate A high-voltage pulse source that achieves a fast slew rate of 1000V/μs enables the generation of sharper edges. - PXIe Interface Based on PXIe interface design, it can be fitted into a standard PXIe chassis. Multi-channel expansion is easy, and it supports chassis sharing with other PXIe measurement instruments, allowing for the construction of a highly convenient semiconductor testing system. - Multi-Level Pulse Output It supports 2-level and 3-level pulse outputs, enabling combinations of multiple pulses to meet the needs for multi-stage pulses in semiconductor testing. - ALWG Function It supports user text editing based on CSV, allowing for the output of arbitrary linear waveform signals. - Software Features The GUI is designed to be very intuitive and concise, making it easy to configure the output voltage waveform settings for each channel.
basic information
- Supports output of ±40V and NVM testing - Compatible with custom waveforms, making SPGU application setup easy - Frequency range: 0.1 to 33 MHz
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Applications/Examples of results
This product serves as a high-speed pulse source measurement unit, featuring narrow pulse width, fast rise edge, and high-precision pulse output and measurement capabilities, making it suitable for the stringent testing conditions of various semiconductor devices. Main applications include instantaneous operation evaluation of medium-power devices (such as MOSFETs and IGBTs), write and erase cycle testing of non-volatile memory (NVM), and evaluation of actuation characteristics in MEMS devices. It is ideal for applications requiring strict response time tests and precise control of pulse voltage, and is utilized across a wide range of fields from research and development to manufacturing line process evaluation.
