BI6201 – Laser Diode Burn-In System
4224ch simultaneous burn-in, maximizing efficiency of LD reliability testing.
BI6201 is a high-density, multifunctional test system specifically designed for burn-in lifetime verification of semiconductor laser chips. By adopting a modular structure and a large-area single-layer design, it integrates multi-channel power supplies, temperature control, real-time data acquisition, standardized drawer structures, and flexible fixture configurations, significantly reducing system costs. ▶ Compatibility with Package and Fixture Flexibility It can accommodate various package shapes and sizes, such as CoC (Chip on Carrier). Custom fixtures are designed for easy one-touch replacement, allowing for quick swaps based on product types. ▶ High Reliability Drive and Protection Features The driver circuit of the BI6201 is equipped with an excellent current/voltage protection network. It is designed to thoroughly eliminate risks of EOS (Electrical Over Stress) such as: - Preventing current/voltage overshoot - Automatically disconnecting the relevant channel if the set threshold is exceeded - Avoiding damage to the test target chip Additionally, the control circuit incorporates isolation performance between channels and ESD (Electrostatic Discharge) protection design, ensuring long-term stable operation and reliability assurance.
basic information
▶Features High-density, multifunction burn-in system. Supports up to 4224 channels with a four-quadrant SMU power supply. The fixtures can accommodate various CoC packages. ▶Temperature Control Each fixture is equipped with independent control functionality. Temperature stability within ±1℃ (40–100℃) ▶Safety Features EOS prevention circuit, ESD protection, channel-independent shutdown capability ▶Power Monitoring Supports LIV/EA scanning. Reproducibility deviation within ±1% (optional) ▶Software Functionality All test logs are managed in a database and are traceable ▶Scalability Flexible support through fixture replacement and configuration changes
Price information
Excellent cost performance! Please feel free to contact us.
Delivery Time
Model number/Brand name
Laser diode CoC burn-in device
Applications/Examples of results
Evaluation and implementation are already underway with top-class companies in the industry, and they are actively adopting it.
Detailed information
Line up（2）
| Model number | overview |
|---|---|
| BI6201 | Up to 4224 channels. 4-quadrant SMU power supply. High-density, multifunction burn-in lifetime verification system. Ideal for reliability evaluation of semiconductor laser chips. |
| BI6202 | Up to 8448 channels. Standard power supply. An expanded model of the BI6201. Designed for higher channel support and high throughput production. |
