S2019C PXIe Source Measure Unit (SMU)
4-channel, high resolution, high-speed sampling — PXIe SMU supporting a variety of devices and applications.
The S2019C is a 4-channel PXIe Source Measure Unit (SMU) that combines high precision, compactness, and high cost performance. It supports both voltage and current output and measurement, with a maximum output of ±40V, ±500mA (DC), and ±1A (pulse). It is compatible with conventional SCPI commands, making programming easy. It widely supports standard PXIe chassis and also supports synchronized operation of multiple cards. The S2019C can be integrated into mass production test environments, contributing to improved test efficiency and cost reduction.
basic information
▶ High resolution (1μV/1pA) Current resolution of 1pA and voltage resolution of 1μV. Capable of precisely measuring nA level leakage currents and μV level fine signals. ▶ 4-channel independent and synchronized control Simultaneous output and measurement on 4 channels significantly improves the efficiency of IV measurements and characteristic scans for multiple devices. ▶ ±40V/±1A wide range and bidirectional output Supports output of ±40V/±500mA (DC) and ±1A (pulse). Ideal for high-precision sensor and semiconductor device testing. ▶ 1MS/s high-speed sampling + APFC control 1MS/s high-speed ADC + APFC (Adaptive Precision Control) responds immediately to fine output fluctuations, minimizing measurement delays. ▶ Multi-card synchronization + automation support PXIe compliant. Supports multi-card synchronization expansion, trigger synchronization, and SCPI control. Compatible with C#/Python/C/C++/LabVIEW.
Price information
Excellent cost performance! Please feel free to contact us.
Delivery Time
Model number/Brand name
4-channel PXIe source measure unit
Applications/Examples of results
▶ Semiconductor Device IV Characteristic Measurement Supports high-precision sweep measurements with ±40V/±1A voltage and current sources for MOSFETs, IGBTs, BJTs, etc. ▶ Silicon Photonics Chip Testing Stably measures nA-level dark current with 1pA resolution, supporting reliability evaluation of 800G optical modules with 4-channel parallel and multi-probe configurations. ▶ Sensor and MEMS Device Evaluation Supports micro-signal measurements at the μV/nA level, utilized for sensitivity calibration and environmental response testing applications. ▶ Automated Inspection System Compatible with PXIe standards, has a proven track record of integration into mass production lines using SCPI commands and control via C/C++/Python/LabVIEW.
Detailed information
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【Application Example】IV Characteristic Evaluation of Semiconductor Devices ▶Application Field IV characteristic analysis of semiconductor devices (MOSFET, IGBT, BJT) ▶Main Features With a wide voltage and current output range of ±40V/±1A and high resolution of 1μV/1pA, it enables high-precision measurement of current changes from nA to A level. ▶Economy/Efficiency Supports 4-channel independent output on a single card and accommodates 4-terminal configuration devices, achieving high-efficiency evaluation while keeping test costs low.
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【Application Example】— Silicon Photonics Wafer Testing: Achieving Measurement of Micro Dark Current in Highly Integrated Chips ▶ Application Field Dark current testing at the wafer level of silicon photonics devices ▶ Challenges Addressed Measurement of nA-level dark current in highly integrated chips (directly linked to product yield and performance assessment) ▶ Main Features - Stable measurement of small leakage currents with 1pA resolution - Supports simultaneous measurement with multiple probes in a 4-channel parallel configuration - Capable of high-speed and wide-range IV measurements ▶ Applicable Targets SiPh devices, 800G optical modules, laser chips, etc.
