WAT6600 Wafer Acceptance Test
Simultaneous measurement of 48 pins with an accuracy of 1 pA. Maximizing throughput with parallel measurements.
The WAT6600 is a highly efficient parallel parametric test system that supports DC measurements and capacitance measurements, as well as high-frequency characteristic evaluations such as ring oscillator testing and flash memory testing. It can measure multiple channels simultaneously, significantly improving throughput in wafer processes. With a balance of accuracy and speed, it is ideal for mass production lines and evaluation processes. Key features: - Accurate DC/CV measurements - Support for high-frequency applications (such as ring oscillator measurements) - Capability for functional evaluation of flash memory - Reduced test time due to high parallelism
basic information
▶In-house developed hardware Consistent development from measurement modules to control units. Achieves stable supply and short delivery times. ▶High output and high voltage support Power output of up to 200V / 1A per pin (SMU), and pulse signals of ±40V are also possible (PGU). ▶48-pin support Supports up to 48 pins for full Kelvin measurement. Simultaneous measurement of multiple devices is possible. ▶High precision measurement Ultra-low current measurement at the 1pA level, with system leakage current <500fA. ▶SECS/GEM compliant Easy integration with EAP and FA systems. Fully compatible with automation. ▶Maintenance support features Rapid troubleshooting and calibration with built-in software (CAL/DIAG/PV). Maintains stable performance. ▶Compatible with mainstream probers Compatible with major manufacturers such as TEL (P8XL/P12/Precio XL) and TSK (UF200/UF3000). ▶48-pin probe card compatibility Can use 48-pin cards compatible with φ230mm. Minimizes transition costs from existing equipment.
Price information
Excellent cost performance! Please feel free to contact us.
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Model number/Brand name
Parallel Parametric Test System
Applications/Examples of results
WAT6600 is a highly efficient parallel parametric test system that can quickly perform high-frequency applications such as accurate DC measurements, capacitance measurements, and ring oscillator measurements, as well as flash memory testing. It is already being evaluated and implemented by top-class companies in the industry, and is being actively adopted.
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We are a global supplier of advanced testing and measurement equipment. We provide high-performance and highly integrated measurement solutions that can support everything from research and development to mass production processes in cutting-edge fields such as high-speed communication, optical chips, electronic measurement, and power semiconductors. Since our founding, we have placed "Dedication and Craftsmanship" at the core of our corporate values, pursuing product development that combines deep insights into measurement principles with a spirit of craftsmanship. Aiming to be "the best testing solution company supporting global technological innovation," we will continue to provide high-performance, high-efficiency, and highly reliable solutions to address global industrial challenges.