WAT6600 Wafer Acceptance Test
Simultaneous measurement of 48 pins with an accuracy of 1 pA. Maximizing throughput with parallel measurements.
The WAT6600 is a highly efficient parallel parametric test system that supports DC measurements and capacitance measurements, as well as high-frequency characteristic evaluations such as ring oscillator testing and flash memory testing. It can measure multiple channels simultaneously, significantly improving throughput in wafer processes. With a balance of accuracy and speed, it is ideal for mass production lines and evaluation processes. Key features: - Accurate DC/CV measurements - Support for high-frequency applications (such as ring oscillator measurements) - Capability for functional evaluation of flash memory - Reduced test time due to high parallelism
basic information
▶In-house developed hardware Consistent development from measurement modules to control units. Achieves stable supply and short delivery times. ▶High output and high voltage support Power output of up to 200V / 1A per pin (SMU), and pulse signals of ±40V are also possible (PGU). ▶48-pin support Supports up to 48 pins for full Kelvin measurement. Simultaneous measurement of multiple devices is possible. ▶High precision measurement Ultra-low current measurement at the 1pA level, with system leakage current <500fA. ▶SECS/GEM compliant Easy integration with EAP and FA systems. Fully compatible with automation. ▶Maintenance support features Rapid troubleshooting and calibration with built-in software (CAL/DIAG/PV). Maintains stable performance. ▶Compatible with mainstream probers Compatible with major manufacturers such as TEL (P8XL/P12/Precio XL) and TSK (UF200/UF3000). ▶48-pin probe card compatibility Can use 48-pin cards compatible with φ230mm. Minimizes transition costs from existing equipment.
Price information
Excellent cost performance! Please feel free to contact us.
Delivery Time
Model number/Brand name
Parallel Parametric Test System
Applications/Examples of results
WAT6600 is a highly efficient parallel parametric test system that can quickly perform high-frequency applications such as accurate DC measurements, capacitance measurements, and ring oscillator measurements, as well as flash memory testing. It is already being evaluated and implemented by top-class companies in the industry, and is being actively adopted.
