Dual Side Flying Probe Tester APT-1600FD-SL
The probe head is arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)
The simultaneous use of upper and lower flying probes enables a combination inspection of up to 6 probes, allowing for the inspection of components that can make contact at both points on the top and bottom of the substrate. This model boasts world-class standards in speed and positioning accuracy while expanding the compatible substrate size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long substrates up to W985×D610mm. It can accommodate component heights of up to 60mm and substrate weights of up to 10kg, making it suitable for inspecting substrates used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★Evaluation tests can be conducted by bringing your substrates to the demo room at our Okayama headquarters★ The entire process from creating inspection programs, inspecting using actual substrates, to summarizing evaluation results can be tested in a single flow. If you are interested, please apply through the 'Contact Us' section below.
basic information
To ensure that electronic devices function correctly, the electronic circuit board within the device must operate normally. The electronic circuit board becomes operational when electronic components are correctly mounted on the printed circuit board (substrate) and power is supplied. The process of contacting a specialized probe to the electronic circuit board, which has electronic components mounted on it, and applying minute electrical signals for testing is called In-Circuit Testing (ICT), and the device used for this testing is referred to as an In-Circuit Tester. This testing checks the "connection reliability between electronic components and the substrate," "the values of individual mounted electronic components (such as resistors and capacitors)," and "the polarity of diodes," without applying unnecessary load to the substrate itself. It is also known as MDA (Manufacturing Defect Analyzer). Main inspection contents: - Solder shorts and opens - Pattern disconnections - Missing components - Incorrect component values - Reverse insertion of polarized components - Lifted leads of ICs and connectors - Operation confirmation of digital transistors, optocouplers, and Zener diodes - Other simple function tests
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Applications/Examples of results
【Adopted Industries】 EMS, EMDS companies Semiconductor manufacturing equipment Communication infrastructure and servers Automotive, aircraft, and marine Medical devices Industrial machinery and robots FA machine tools Power generation and power systems 【Use Cases】 ■ Inspection of mass-produced items Connected to loaders/unloaders for automated/unmanned inspection even in large lots ■ Inspection of multi-variety small quantity substrates No need for dedicated jig manufacturing costs; easy identification of defective areas ■ Inspection of prototype substrates Function tests that respond immediately to design changes (applying voltage to the substrate to confirm circuit operation (ON/OFF) and measure direct current) ■ Implementation confirmation inspection during model switching Verification of the mounting program for the first lot and checking for set mistakes during model switching ■ Defect analysis inspection Inspection of substrates that failed functional tests and defect analysis of substrates that failed in the market There are also various other applications where we have achieved results. For more details, please contact your sales representative.
Detailed information
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Line up（4）
| Model number | overview |
|---|---|
| APT-1600FD | Dual-side inspection compatible machine |
| APT-1600FD-A | Dual-side inspection compatible, inline machine (model with automatic transport conveyor) |
| APT-1600FD-SL | Dual-side inspection, large board compatible machine |
| APT-1600FD-SL-A | Dual-side inspection, large board compatible, inline machine |
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News about this product（25）
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We will exhibit at Productronica China 2025 held in Shanghai, China.
We are pleased to announce our participation in an overseas exhibition. Itochu Corporation and Shanghai Eternal Machinery will exhibit the Takaya Corporation's flying probe testers at productronica China 2025, which will be held in Shanghai, China. Event Overview Date: March 26 (Wednesday) to March 28 (Friday), 2025 Hours: - March 26-27: 9:00 AM to 5:00 PM - March 28: 9:00 AM to 4:00 PM Exhibited Models: APT-2600FD-A (Dual Vertical Probe / Double-Sided Tester) APT-1600FD-SL-A (Dual Vertical Probe / Double-Sided Tester) We sincerely look forward to your visit. We are excited to meet you at the exhibition.
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The global site for the flying probe tester has been renewed.
Please see the TAKAYA Flying Probe Tester page from the related links below. Takaya Corporation has entered into a dealership agreement with Itochu Corporation for overseas sales, establishing sales/service bases for flying probe testers in the United States, Europe, China, and Southeast Asia, with numerous sales achievements in over 46 countries. We will continue to regularly provide information on agents in various countries and details about our participation in overseas exhibitions. You can also rely on us for the introduction and local setup of flying probe testers at overseas bases.
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I received the Excellent Award at the 38th Electronics Packaging Society Spring Conference.
From March 13 (Wednesday) to 15 (Friday), 2024, at the "38th Spring Conference of the Electronics Packaging Society" held at Tokyo University of Science, Takaya Corporation presented a lecture titled "Latest Trends in Hybrid Testing Systems Combining JTAG Inspection and Flying Probe Testers," which received the Excellence Award at the conference. On September 12, 2024, a ceremony was held at Daido University in Aichi Prefecture during the "MES2024 Symposium," where we were presented with a commemorative plaque.
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I was interviewed by "The Window of the Circuit Board."
From July 12 to 14, 2024, Takaya Corporation's Industrial Equipment Division exhibited at the "Electronic Equipment Total Solution Exhibition 2024 (JPCA Show 2024)" held at Tokyo Big Sight. During the event, we were interviewed by the PCB information site "Kiban no Madoguchi," and the footage has been published on the Kiban no Madoguchi YouTube channel. Please take a look!
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MES2024 34th Microelectronics Symposium Exhibition Booth Participation Information
Takaya Corporation will exhibit a corporate booth at the "MES024 34th Microelectronics Symposium," which will be held from September 11 (Wednesday) to 13 (Friday), 2024, at the Daido University Takiharu Campus in Minami Ward, Nagoya City. When you visit the symposium, please be sure to stop by Takaya's booth. Organizing Office (The Japan Society of Electronics Packaging) 167-0042 Tokyo, Suginami Ward, Nishiogikita 3-12-2 TEL: 03-5310-2010 For details and the latest information, please refer to the related materials flyer and the MES2024 website.
