Introduction of options for flying probe testers
Introduction of options for flying probe testers
The flying probe tester has a variety of optional features developed in response to customer requests. Here are some of them.
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In-circuit + image composite inspection possible!! (ICT + AOI)
Expanded reliability through a combination of electrical testing and imaging inspection!!
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Safe updates/upgrades from the old model! Automatic conversion of inspection programs.
The Takaya APT series is a circuit board inspection device capable of industry-leading ultra-high-speed in-circuit testing.
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Automatically collect/analyze inspection results!! Standard statistical features included.
The Takaya APT series is a circuit board inspection device capable of industry-leading ultra-fast in-circuit testing.
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Optimal for electrical testing of mass-produced PCBs (ICT)!! Introduction of the inline model.
The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing.
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Takaya's unique 4-head & 6 flying probe system (vertical drop)
Takahashi Flying Probe Tester expands its defect detection capabilities with a unique system!!
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Are you having trouble with automatic LED light emission inspection?
Measure the emission color/brightness of LEDs quantitatively with a unique color sensor!! 【LED Color Test System】
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Do you want to electrically detect IC lead lift and BGA ball lift?
TAKAYA's unique IC open test system
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Are you having trouble creating inspection programs for flying probe testers?
Many successful implementations! Tester for PCB inspection using flying probe method! Trial available! Easy operation allows anyone to create inspection programs!
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TPS-13 Inspection Program Creation Support Software
Contributes to reducing operator workload and improving inspection efficiency with intuitive and easy-to-understand operations.
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Collaboration with boundary scan testing using a flying probe tester.
We will create new value through the mutual complementarity of ICT and BST.
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Multi-Probe System (Exclusive Option for 1600/2600FD)
Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.
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For large-scale substrate in-circuit testing, please consider Takaya!
Supports DIB and PIB inspections!
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Implementation Technology Journal Electronics Implementation Technology Special Feature Article Published
We have received permission to publish the feature article that was included in the only domestic magazine specializing in implementation technology, "Electronics Implementation Technology." You can view it here.
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Leakage current measurement function
Introducing the Takaya Flying Probe Tester option. It also supports leakage current measurement.
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Low resistance measurement mode (0.1mΩ～) [Under development]
Introducing the Takaya Flying Probe Tester. We are challenging the measurement of low resistance (0.1mΩ and below).
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Integration features with MES systems compatible with the international standard OPC UA.
Exhibiting at Nepcon 2024 from January 24! Achieving interoperability between industrial equipment and MES systems!
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