In-circuit + image composite inspection possible!! (ICT + AOI)

Expanded reliability through a combination of electrical testing and imaging inspection!!

last updated Dec 19, 2025

Safe updates/upgrades from the old model! Automatic conversion of inspection programs.

Dramatically improve inspection efficiency! Information on updates and expansions to the latest flying probe tester.

last updated Dec 19, 2025

Automatically collect/analyze inspection results!! Standard statistical features included.

The Takaya APT series is a circuit board inspection device capable of industry-leading ultra-fast in-circuit testing.

last updated Dec 19, 2025

Optimal for electrical testing of mass-produced PCBs (ICT)!! Introduction of the inline model.

The Takaya APT series is a board inspection device capable of industry-leading ultra-fast in-circuit testing.

last updated Dec 19, 2025

Takaya's unique 4-head & 6 flying probe system (vertical drop)

Takahashi Flying Probe Tester expands its defect detection capabilities with a unique system!!

last updated Apr 04, 2025

Are you having trouble with automatic LED light emission inspection?

Measure the emission color/brightness of LEDs quantitatively with a unique color sensor!! 【LED Color Test System】

last updated Apr 04, 2025

Do you want to electrically detect IC lead lift and BGA ball lift?

TAKAYA's unique IC open test system

last updated Apr 04, 2025

Are you having trouble creating inspection programs for flying probe testers?

Many successful implementations! Tester for PCB inspection using flying probe method! Trial available! Easy operation allows anyone to create inspection programs!

last updated Dec 19, 2025

TPS-13 Inspection Program Creation Support Software

Contributes to reducing operator workload and improving inspection efficiency with intuitive and easy-to-understand operations.

last updated May 09, 2025

Collaboration with boundary scan testing using a flying probe tester.

We will create new value through the mutual complementarity of ICT and BST.

last updated Apr 04, 2025

Multi-Probe System (Dedicated Option for APT-2600FD)

Programming for FPGAs and special performance tests such as BST can be handled with a flying probe tester.

last updated Dec 01, 2025

For large-scale substrate in-circuit testing, please consider Takaya!

Supports DIB and PIB inspections!

last updated Dec 19, 2025

Implementation Technology Journal Electronics Implementation Technology Special Feature Article Published

We have received permission to publish the feature article that was included in the only domestic magazine specializing in implementation technology, "Electronics Implementation Technology." You can view it here.

last updated Apr 04, 2025

Leakage current measurement function

Introducing the Takaya Flying Probe Tester option. It also supports leakage current measurement.

last updated Dec 19, 2025

Low resistance measurement mode (0.1mΩ～) [Under development]

Introducing the Takaya Flying Probe Tester. We are challenging the measurement of low resistance (0.1mΩ and below).

last updated Dec 19, 2025

Integration features with MES systems compatible with the international standard OPC UA.

Exhibiting at Nepcon 2024 from January 24! Achieving interoperability between industrial equipment and MES systems!

last updated Apr 04, 2025

Multi-probe × Fixture-less JTAG Boundary Scan Test

A JTAG testing experience without the need for fixtures, realized with flying probes and multi-probes.

last updated Feb 03, 2026