Do you want to electrically detect IC lead lift and BGA ball lift?
TAKAYA's unique IC open test system
*You can view detailed features in the catalog.* The TAKAYA flying probe tester is equipped with a system that uses a uniquely developed sensor probe to quickly detect issues such as lifted leads and solder defects in ICs like BGA, QFP, and SOJ. It can electrically detect lifted lead defects in narrow-pitch ICs and ball lift defects in BGAs without damaging the IC itself. We welcome inquiries for trials and tests. If you have any concerns, please feel free to contact us. *You can view detailed information in the catalog.*
basic information
Takaya is highly regarded as a leading manufacturer of flying probe testers representing Japan, receiving acclaim in countries around the world. Its areas of activity extend beyond the home appliance industry to a wide range of fields, including the medical device industry and automotive industry, which require high quality standards, as well as the aerospace industry, which has very high entry barriers.
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Applications/Examples of results
【Hiring Industry】 EMS, EMDS companies Semiconductor manufacturing equipment Communication infrastructure and servers Automotive, aircraft, and ships Medical devices Industrial machinery, robots FA machine tools Power generation and power systems
