フライングプローブテスタ
フライングプローブテスタ
超高速検査で実装基板のあらゆる不良を確実に検出し、世界トップシェアの圧倒的実力を誇るフライングプローブ式のインサーキットテスタです。タカヤ株式会社は、世界で初めて『フライングプローブテスタ』を開発/販売した実装基板検査業界のリーディングカンパニーです。
1～15 件を表示 ／ 全 15 件
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Detecting defects in implemented circuit boards with ultra-high-speed inspection. An evolved in-circuit tester.
Top-class industry share! Introduction of the flying probe tester.
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Flying Probe Tester: APT-1340J *Evaluation tests currently accepted
It is a board inspection device capable of ultra-fast in-circuit testing at a top-class level in the industry.
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Flying Probe Tester: APT-1400F-SL * Testing in progress
It is a board inspection device capable of ultra-fast in-circuit testing at a top-class industry level. (Supported board size for inspection: up to 985×610)
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Dual Side Flying Probe Tester: APT-1600FD
This is a flagship model that arranges probe heads on both the top and bottom, enabling simultaneous in-circuit testing of the front and back of the substrate.
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Dual Side Flying Probe Tester APT-1600FD-SL
The probe head is arranged above and below, allowing for simultaneous in-circuit testing of both sides of the substrate. (Supported substrate size for inspection: up to 985×610)
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Integration features with MES systems compatible with the international standard OPC UA.
Exhibiting at Nepcon 2024 from January 24! Achieving interoperability between industrial equipment and MES systems!
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Announcement of the 20th "JPCA Award" Winner
We have won the 20th "JPCA Award"!
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We will exhibit a corporate booth at MES2024.
We will exhibit a corporate booth at the 34th Microelectronics Symposium ES2024!
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Flying Probe Tester APT-2400F
Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!
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Dual Side Flying Probe Tester APT-2600FD
A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!
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Flying Probe Tester APT-2400F / 2600FD
2025 Electronics Packaging Society Technical Award Winner!" "55th Mechanical Industry Design Award IDEA Winner!
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Flying Probe Tester APT-2400F-SL
Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!
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Dual Side Flying Probe Tester APT-2600FD-SL
A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!
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We exhibited at the 39th NePCON Japan.
The new model of the flying probe tester is making its domestic debut!
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We received the 55th Industrial Design Award IDEA.
Design philosophy focused on the future of the industry has been highly praised and has won a prestigious design award.
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