Flying Probe Tester APT-2400F-SL
Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!
The APT-2400F-SL is a large model that maintains the basic performance of the APT-2400F while expanding the compatible board size to W635×D610mm. Furthermore, by adding an optional split inspection function, it is capable of inspecting long boards up to W985×D610mm. It can accommodate component heights of up to 60mm on the top and 120mm on the bottom, and can handle board weights of up to 15kg, making it suitable for inspecting large and heavy boards such as those used in automotive, aerospace, medical devices, power supply boards, and probe cards. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing with actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.
basic information
In the electronic circuit board manufacturing industry, there is a growing demand for high performance and miniaturization, requiring the implementation of numerous components in limited space, and the demands for inspection accuracy and efficiency are increasing. Our latest model, the "APT-2400F/APT-2600FD series," is a groundbreaking inspection device developed to meet these industry needs, incorporating the highest standards of technology in the industry. Key features of the new model: 1. Comprehensive design of all hardware and software in-house 2. Newly developed motor system and inspection probe mechanism 3. CMOS color camera with liquid lens 4. Remote camera 5. Automatic cleaner for inspection probes (optional) 6. Temperature sensor (optional) 7. Universal design 8. Versatile expansion features to meet a wide range of industry needs *For more details, please download the PDF materials or feel free to contact us.
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News about this product(15)
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Our case study has been featured on the official website of i-PRO Co., Ltd.
Recently, a case study of Takaya Corporation has been published on the official website of i-PRO Co., Ltd. Our company has been addressing the challenge of developing and manufacturing a new type of flying probe tester by establishing a system to remotely understand the internal conditions of the equipment and expedite initial response. As a solution, we have introduced i-PRO's network cameras, achieving faster troubleshooting through real-time monitoring and enhancing quality control in the inspection process. In this case study, the background of the introduction, reasons for product selection, operational innovations, and the effects after implementation are presented from the perspective of the on-site personnel. Please take a look at the related link below.
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MES2025 35th Microelectronics Symposium Company Exhibition Information (Osaka University Nakanoshima Center)
Takaya Corporation will be exhibiting at the "MES2025 35th Microelectronics Symposium," which will be held for three days from September 3 (Wednesday) to September 5 (Friday), 2025, at the Osaka University Nakanoshima Center in Osaka City, Osaka Prefecture. Takaya plans to showcase a panel related to the APT series of flying probe testers. This symposium is a valuable opportunity to gather the latest research results and industry trends regarding electronic device packaging technology. We warmly invite you to visit Takaya's booth when you attend. We look forward to welcoming you.
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The dual-side flying probe tester "APT-2600FD" has received the Nikkan Kogyo Shimbun 110th Anniversary Award at the 55th Mechanical Industry Design Award IDEA.
The "APT-2600FD" is an in-circuit tester that inspects the continuity and resistance values of circuit boards with high precision. The "flying probe" test technology, which uses high-speed contact probes, was developed by Takaya as the world's first and boasts a world-class market share. This product has undergone a model change after 10 years and is equipped with numerous advanced technologies, including sophisticated control functions to prevent board damage and a high-resolution image inspection system. It achieves a balance between precision and efficiency, establishing a new standard for quality assurance. This award is a testament to our technological prowess and design excellence, serving as an encouragement for further technological innovation. We sincerely thank all those involved in the development, manufacturing, and implementation of this product, as well as the judges who provided valuable feedback and evaluations during the review process. About the "Industrial Design Award IDEA": Established in 1970 by the Nikkan Kogyo Shimbun, this award aims to promote design in Japanese industrial products. It is evaluated from multiple perspectives, including product functionality, appearance, marketability, social impact, and safety. The judging committee is composed of experts from relevant government ministries, universities, and industrial organizations, and this year marks the 55th edition of the award.
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We will exhibit at the Total Solution Exhibition for Electronic Devices 2025.
We would like to express our sincere gratitude for your continued support. Takaya Corporation will be exhibiting at the "Total Solution Exhibition for Electronic Devices 2025," which will be held at Tokyo Big Sight from June 4 (Wednesday) to June 6 (Friday), 2025. Introduction of Exhibited Products From the Industrial Equipment Division, we will showcase the new model of the Flying Probe Tester, APT-2600FD-A. The APT-2600FD-A is a groundbreaking inspection device that boasts industry-leading probing accuracy, suitable for testing high-density mounted circuit boards. With its unique control mechanism and sensing technology, it achieves reliable electrical testing in various environments. Additionally, from the RF Division/Solutions Division, we will present the latest solutions for the challenge of "Creating the Future of DX in Manufacturing with RFID." We look forward to welcoming you to our booth.
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The flying probe tester has received the "Technology Award" from the Electronics Packaging Society.
Takaya Corporation's flying probe tester has received the "Technology Award" from the Japan Institute of Electronics Packaging (hereinafter referred to as "JIEP"). This award is one of the honors given by JIEP to recognize achievements and contributions related to the development and education of packaging technology, primarily awarded for technologies that have made significant contributions to the advancement of electronics packaging technology. Awardees: Kouki Yanagida, Masahiro Yamamoto Awarded Technology: Development of a high-speed flying probe inspection machine for printed circuit board assembly We are deeply honored that our flying probe tester has received the prestigious "Technology Award." We sincerely appreciate the efforts and passion of all those involved in the development of this technology, as well as the ongoing support from our customers and partners. Takaya Corporation will continue to pursue "technologies that bring innovation to the manufacturing field" and contribute to the further development of the electronics packaging sector.