Dual Side Flying Probe Tester APT-2600FD
A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!
The APT-2600FD is a next-generation dual-side flying probe tester that can perform combination testing with up to 6 probes using both upper and lower flying probes simultaneously. It improves test coverage while reducing the risk of product damage due to board flipping operations, significantly shortening inspection time. Equipped with a high-performance measurement system and a variety of features, it contributes to quality improvement from prototyping to mass production. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your boards. A complete testing process is possible, including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.*
basic information
In the electronic circuit board manufacturing industry, there is a growing demand for high performance and miniaturization, requiring the implementation of numerous components in limited spaces, and the demands for inspection accuracy and efficiency are increasing. Our latest model, the "APT-2400F/APT-2600FD series," is a groundbreaking inspection device developed to meet these industry needs, incorporating the highest level of technology in the industry. Key features of the new model: 1. Comprehensive design of all hardware and software in-house 2. Newly developed motor system and inspection probe mechanism 3. CMOS color camera with liquid lens 4. Remote camera 5. Automatic cleaner for inspection probes (optional) 6. Temperature sensor (optional) 7. Universal design 8. Versatile expansion features to meet a wide range of industry needs *For more details, please download the PDF materials or feel free to contact us.
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News about this product(18)
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Our case study has been featured on the official website of i-PRO Co., Ltd.
Recently, a case study of Takaya Corporation has been published on the official website of i-PRO Co., Ltd. Our company has been addressing the challenge of developing and manufacturing a new type of flying probe tester by establishing a system to remotely understand the internal conditions of the equipment and expedite initial response. As a solution, we have introduced i-PRO's network cameras, achieving faster troubleshooting through real-time monitoring and enhancing quality control in the inspection process. In this case study, the background of the introduction, reasons for product selection, operational innovations, and the effects after implementation are presented from the perspective of the on-site personnel. Please take a look at the related link below.
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MES2025 35th Microelectronics Symposium Company Exhibition Information (Osaka University Nakanoshima Center)
Takaya Corporation will be exhibiting at the "MES2025 35th Microelectronics Symposium," which will be held for three days from September 3 (Wednesday) to September 5 (Friday), 2025, at the Osaka University Nakanoshima Center in Osaka City, Osaka Prefecture. Takaya plans to showcase a panel related to the APT series of flying probe testers. This symposium is a valuable opportunity to gather the latest research results and industry trends regarding electronic device packaging technology. We warmly invite you to visit Takaya's booth when you attend. We look forward to welcoming you.
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The award ceremony for the 55th Industrial Design Award IDEA was held.
On July 31, 2025 (Thursday), at the Keidanren Kaikan in Tokyo, our product "APT-2600FD (Dual-Side Flying Probe Tester)" received the "Nikkankogyo Shimbun 110th Anniversary Award" at the "55th Mechanical Industry Design Award IDEA" ceremony. This year, there were 34 companies with 37 entries from across the country, and 19 entries were selected for awards. The APT-2600FD was highly regarded as a next-generation model that features a unique structure enabling simultaneous inspection of both sides, along with the industry's highest standards of inspection speed and accuracy. At the award ceremony, the judging committee commented, "The design philosophy that balances inspection efficiency and reliability is excellent," providing an opportunity for our technological and product design capabilities to be widely recognized. This award is the result of the efforts of each employee involved in product development, and it could not have been achieved without the support and cooperation of our clients and stakeholders, as well as the assistance of the judges who conducted the evaluation. We sincerely thank you. Moving forward, Takaya Corporation will continue to contribute to society through the creation of high-quality and reliable products.
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The dual-side flying probe tester "APT-2600FD" has received the Nikkan Kogyo Shimbun 110th Anniversary Award at the 55th Mechanical Industry Design Award IDEA.
The "APT-2600FD" is an in-circuit tester that inspects the continuity and resistance values of circuit boards with high precision. The "flying probe" test technology, which uses high-speed contact probes, was developed by Takaya as the world's first and boasts a world-class market share. This product has undergone a model change after 10 years and is equipped with numerous advanced technologies, including sophisticated control functions to prevent board damage and a high-resolution image inspection system. It achieves a balance between precision and efficiency, establishing a new standard for quality assurance. This award is a testament to our technological prowess and design excellence, serving as an encouragement for further technological innovation. We sincerely thank all those involved in the development, manufacturing, and implementation of this product, as well as the judges who provided valuable feedback and evaluations during the review process. About the "Industrial Design Award IDEA": Established in 1970 by the Nikkan Kogyo Shimbun, this award aims to promote design in Japanese industrial products. It is evaluated from multiple perspectives, including product functionality, appearance, marketability, social impact, and safety. The judging committee is composed of experts from relevant government ministries, universities, and industrial organizations, and this year marks the 55th edition of the award.
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We will exhibit at the Total Solution Exhibition for Electronic Devices 2025.
We would like to express our sincere gratitude for your continued support. Takaya Corporation will be exhibiting at the "Total Solution Exhibition for Electronic Devices 2025," which will be held at Tokyo Big Sight from June 4 (Wednesday) to June 6 (Friday), 2025. Introduction of Exhibited Products From the Industrial Equipment Division, we will showcase the new model of the Flying Probe Tester, APT-2600FD-A. The APT-2600FD-A is a groundbreaking inspection device that boasts industry-leading probing accuracy, suitable for testing high-density mounted circuit boards. With its unique control mechanism and sensing technology, it achieves reliable electrical testing in various environments. Additionally, from the RF Division/Solutions Division, we will present the latest solutions for the challenge of "Creating the Future of DX in Manufacturing with RFID." We look forward to welcoming you to our booth.