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Flying Probe Tester APT-2400F

Equipped with a high-performance measurement system and a variety of functions, it contributes to quality improvement from prototyping to mass production!

The APT-2400F is a next-generation flying probe tester that boasts industry-leading probing accuracy capable of inspecting high-density mounted circuit boards. With its unique control mechanisms and sensing technology, it achieves highly reliable electrical testing in all environments. We accept evaluation tests at our demonstration rooms in Okayama headquarters and Tokyo branch, where you can bring in your circuit boards. We can conduct a series of tests including the creation of inspection programs, testing using actual boards, and summarizing evaluation results. *For more details, please feel free to contact us.

Takaya Corporation Industrial Equipment Division

basic information

In the electronic circuit board manufacturing industry, there is a growing demand for high performance and miniaturization, requiring the implementation of numerous components in limited space, and the demands for inspection accuracy and efficiency are increasing. Our latest model, the "APT-2400F/APT-2600FD series," is a groundbreaking inspection device developed to meet these industry needs, incorporating the highest level of technology in the industry. Key features of the new model: 1. Comprehensive design of all hardware and software in-house 2. Newly developed motor system and inspection probe mechanism 3. CMOS color camera with liquid lens 4. Remote camera 5. Automatic cleaner for inspection probes (optional) 6. Temperature sensor (optional) 7. Universal design 8. Versatile expansion features to meet a wide range of industry needs *For more details, please download the PDF materials or feel free to contact us.

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Flying Probe Tester APT-2400F

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[Press Release] Takaya Corporation to Exhibit at the 39th NEPCON Japan

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APT-2400F Series [Chinese Version]

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[Press Release] Takaya Corporation and Estakaya Electronics Co., Ltd. Exhibit at the 1st [Kansai] Nepcon Japan

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[Press Release] Takaya Corporation Announces New Models of Flying Probe Tester "APT-2400F/APT-2600FD Series"

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[Press Release] Exhibiting at the "Total Solution Exhibition for Electronic Devices 2025" *Received the Encouragement Award at the 21st JPCA Awards!

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[Press Release] Takaya Corporation's Flying Probe Tester Wins the "Technology Award" from the Electronics Packaging Society.

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Hybrid inspection system combining JTAG testing and flying probe testers.

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Utilization of ODB++ format

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Industrial Equipment Division Product Introduction

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[Press Release] "APT-2600FD" wins the 55th Industrial Design Award IDEA, commemorating the 110th anniversary of the Nikkan Kogyo Shimbun.

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