We have newly added technical documentation on 'Ion Residues in Electronic Substrates and Their Analytical Methods'.

ゼストロンジャパン

This document explains the analysis of ionic residues on electronic substrates that our company, as a cleaning agent manufacturer, has been working on. It includes explanations about ions and flux, as well as discussions on ion contamination measurement, ion chromatography, and scanning electron microscopy with energy dispersive X-ray spectroscopy. Additionally, it features case studies on the cleaning efficacy of surfactants. Please feel free to download and read it.