Added a page on the causes and countermeasures of ion migration to prevent invisible defects on the substrate.
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Modern electronic devices are highly advanced, and even minor malfunctions can lead to significant incidents. Events that undermine insulation threaten the reliability of products, and one phenomenon that can contribute to this is ion migration, which has been considered a past issue. It has been said that this has been overcome due to the evolution of various insulating materials such as coatings and resists, as well as advancements in cleaning-free technologies. However, as the miniaturization and high density of electronic substrates rapidly progress, ensuring insulation has become increasingly difficult, and the risk of ion migration is once again on the rise. This article will explain why ion migration has become a trend again, exploring its mechanisms, specific countermeasures, and evaluation methods to assess the potential for its occurrence. You can view the detailed content of the article through the related links.
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