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The "ESD (CDM) Testing Contract Service" evaluates the resistance to damage caused by ESD (Electrostatic Discharge) according to device charging models, which are important for the reliability of semiconductor products and electronic components that include them. It supports both the Direct Charge Method (Direct CDM) and the Field Induced Method (Field Induced CDM). Additionally, it is possible to determine damage through diode characteristic evaluation methods and other characteristic assessments (using separate equipment). 【Features】 ■ Compatible with various standard conditions such as JEDEC, JEITA (EIAJ also acceptable), and AEC through unit exchange ■ Supports both the Direct Charge Method (Direct CDM) and the Field Induced Method (Field Induced CDM) ■ Also compatible with the Direct Charge Method and Field Induced Method of AEC-Q100-011 ■ Damage determination is also possible through diode characteristic evaluation methods and other characteristic assessments ■ Ensures reliable application through contact confirmation function of applied pins *For more details, please refer to the PDF document or feel free to contact us.

【Device Specifications】 ■ Applied (Charging) Voltage: 0 to ±4000V ■ Step Voltage: 5V ■ Number of Applications: 1 to 99 times ■ Number of Pins: Up to 1024 pins ■ Application Unit: JEDEC, JEITA, EIAJ, AEC ■ Charging Method 　・D-CDM (Direct Charge Method): JEITA, EIAJ, AEC 　・FI-CDM (Field Induction Method): JEDEC, AEC *For more details, please refer to the PDF document or feel free to contact us.

For more details, please refer to the PDF document or feel free to contact us.