Semiconductor tester for high-speed testing of MLCCs and IPDs.
Expansion of measurement conditions and built-in 64 LCR meters enable faster and more accurate inspections!
Our "R-5920MK2" and "R-5940A" are multi-pin high-speed testers that achieve overwhelming efficiency and speed in the inspection of electronic components such as MLCCs (Multi-Layer Ceramic Capacitors) and IPDs (Integrated Passive Devices). We offer two new models tailored to our customers' inspection needs. 【R5920MK2】 ■ 4W inspection speed increase: Added "designated point output pull-in function" to the scanning unit for reliable judgment in bulk. ■ Improved contamination cleaning function: Cleaning current can be freely modulated and controlled from 100mA to 200mA. ■ Simultaneous parallel inspection with 64 LCR meters: LCR meters are directly built into the scanner card itself. ■ Significant increase in measurement speed: Achieved faster capacitance measurement speed compared to conventional testers. ■ Supports measurement of direct current consumption: Capable of controlling MEMS microphone ICs, allowing for measurement of power consumption.
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Our inspection target areas include printed circuit boards, semiconductor packages, and display panels. These are core components of information and communication devices that are growing increasingly due to advancements in IT, as well as widely adopted digital home appliances. Printed circuit boards, semiconductor packages, and display panels are evolving at an astonishing speed, and higher precision technologies are required in inspections. Our company holds a significant share in these inspection fields that demand cutting-edge technology, and we have delivered numerous products recognized as "de facto standards" in the industry worldwide.