Analysis support tool "Pulse EYE"

Instantly analyze desired characteristic results from R&D to mass production testing! Analysis of test data from other companies is also possible.

last updated Apr 10, 2026

TDAS Series <Performance Test/Durability Test>

Supports ultra-high speed of 36,000 rpm! Cameras and various sensors can also be connected, enabling time-axis synchronized logging.

last updated Apr 10, 2026

IGBT/SiC Power Module Inspection Equipment "NATS Series"

Low LS 4.5nH! Introducing Nidec Advance Technology's inspection equipment.

last updated Apr 10, 2026

Wafer bump automatic inspection system 'RWi-300MK3'

Ideal for gold bump 3D inspection! Achieves simultaneous measurement of 3D/2D/SD with high speed and high precision.

last updated Apr 10, 2026

2D/3D inspection device 'RSH Series'

Support for high-density substrates! We offer a diverse lineup tailored to your needs.

last updated Apr 10, 2026

3D Measurement Device "NSAT Series"

Technology and reliability compatible with glass core! High-speed, high-precision 3D measurement device.

last updated Apr 10, 2026

NS Probe <Printed Circuit Board & Semiconductor Package Board Inspection>

A probe that achieves miniaturization and diversification of advanced shapes using MEMS processes!

last updated Apr 10, 2026

High-precision inspection jig

A 4-terminal fixture for measuring small resistances! Compatible with fine conductors and electrode pads.

last updated Apr 10, 2026

Continuity/Insulation Testing Tester 'RZ-1207'

Compatible with flat cables! Equipped with automatic mechanisms, manual mechanisms, and desktop mechanisms, etc.

last updated Apr 10, 2026

AC/DC MULTI TESTER "R-700 Series"

Micro-capacity inspection with high resolution! Capable of inspecting various products such as thin-film RF filters and accelerometers.

last updated Apr 10, 2026

High-Speed OPEN/LEAK Tester "R-5940"

IC multi-function inspection support! Equipped with an LCR meter developed in-house.

last updated Apr 10, 2026

High-speed S&R type electric inspection device 'STAR REC M6V SW'

Introducing products compatible with HDI/PCB substrates! High-speed/high-precision models available.

last updated Apr 10, 2026

Automatic Inspection Device for Printed Circuit Boards 'STAR REC V5III'

Equipped with a dual-side alignment mechanism! Compatible with the inspection of miniaturized printed circuit boards.

last updated Apr 10, 2026

Large HDI substrate continuity insulation testing device 'GATS-8350'

The overall alignment accuracy is ±5.0μm! Supports a maximum of 64K points up and down.

last updated Apr 10, 2026

High-speed and high-precision inspection device for semiconductor packages 'GATS-7862'

LUL can provide proposals tailored to your specifications! We accommodate a variety of automation requirements.

last updated Apr 10, 2026

High-speed and high-precision inspection device for semiconductor packages 'GATS-7836'

Overall alignment accuracy ±2.5μm! Inspection equipment for large individual pieces/quarter panels.

last updated Apr 10, 2026

High-speed and high-precision inspection equipment for semiconductor packages 'GATS-7760'

Double table/shuttle type! Inspection equipment for FC-CSP/large individual chip substrates.

last updated Apr 10, 2026

Power Module Inspection Device "NSAT Series"

Wide bandgap measurement technology! Achieving high throughput inspection of up to 144 UPH.

last updated Apr 10, 2026

Glass substrate compatible 3D measurement device "NSAT Series"

Advanced substrate support, high-speed and high-precision 3D measurement device! Depth 5μm, Line Space 2/2 compatible.

last updated Apr 10, 2026

Inspection probe compatible with ultra-fine pitch! 'MEMS Probe'

"Inspection probes compatible with ultra-fine pitch" Automatic production system from microfabrication to inspection.

last updated Apr 10, 2026