The flying probe tester has received the "Technology Award" from the Electronics Packaging Society.

TAKAYA Corporation
Takaya Corporation's flying probe tester has received the "Technology Award" from the Japan Institute of Electronics Packaging (hereinafter referred to as "JIEP"). This award is one of the honors given by JIEP to recognize achievements and contributions related to the development and education of packaging technology, primarily awarded for technologies that have made significant contributions to the advancement of electronics packaging technology. Awardees: Kouki Yanagida, Masahiro Yamamoto Awarded Technology: Development of a high-speed flying probe inspection machine for printed circuit board assembly We are deeply honored that our flying probe tester has received the prestigious "Technology Award." We sincerely appreciate the efforts and passion of all those involved in the development of this technology, as well as the ongoing support from our customers and partners. Takaya Corporation will continue to pursue "technologies that bring innovation to the manufacturing field" and contribute to the further development of the electronics packaging sector.
