MES2025 35th Microelectronics Symposium Company Exhibition Information (Osaka University Nakanoshima Center)

TAKAYA Corporation

Takaya Corporation will be exhibiting at the "MES2025 35th Microelectronics Symposium," which will be held for three days from September 3 (Wednesday) to September 5 (Friday), 2025, at the Osaka University Nakanoshima Center in Osaka City, Osaka Prefecture. Takaya plans to showcase a panel related to the APT series of flying probe testers. This symposium is a valuable opportunity to gather the latest research results and industry trends regarding electronic device packaging technology. We warmly invite you to visit Takaya's booth when you attend. We look forward to welcoming you.

Date and time Wednesday, Sep 03, 2025 ～ Friday, Sep 05, 2025
Capital Venue: Osaka University Nakanoshima Center (4-3-53 Nakanoshima, Kita Ward, Osaka City) Format: Hybrid (In-person + Online) [Corporate Exhibition Core Time] September 4 (Thursday) 12:10 PM - 2:10 PM, September 5 (Friday) 11:30 AM - 1:00 PM [Location] 6th Floor Seminar Room
Entry fee Charge Participation requires prior registration and payment of the participation fee.

Related product information

Flying Probe Tester APT-2400F / 2600FD
2025 Electronics Packaging Society Technical Award Winner!" "55th Mechanical Industry Design Award IDEA Winner!

In the electronic circuit board manufacturing industry, there is a trend towards higher performance and miniaturization, requiring the implementation of numerous components in limited spaces, and the demands for inspection accuracy and efficiency are increasing. Our latest model, the "APT-2400F/APT-2600FD series," is a groundbreaking inspection device developed to meet these industry needs by consolidating top-class technology. Key features of the new model: 1. Comprehensive design of all hardware and software in-house 2. Newly developed motor system and inspection probe mechanism 3. CMOS color camera with liquid lens 4. Remote camera 5. Automatic cleaner for inspection probes (optional) 6. Temperature sensor (optional) 7. Universal design 8. Versatile expansion features to meet a wide range of industry needs *For more details, please download the PDF document or feel free to contact us.
Dual Side Flying Probe Tester APT-2600FD-SL
A new innovation in substrate manufacturing. Achieving improvements in production efficiency and inspection accuracy!

In the electronic circuit board manufacturing industry, there is a demand for higher performance and miniaturization, requiring the implementation of numerous components in limited space, and the demands for inspection accuracy and efficiency are increasing. Our latest model, the "APT-2400F/APT-2600FD series," is a groundbreaking inspection device developed to meet these industry needs, incorporating the highest level of technology in the industry. Key features of the new model: 1. Comprehensive design of all hardware and software in-house 2. Newly developed motor system and inspection probe mechanism 3. CMOS color camera with liquid lens 4. Remote camera 5. Automatic cleaner for inspection probes (optional) 6. Temperature sensor (optional) 7. Universal design 8. Diverse expansion features to meet a wide range of industry needs *For more details, please download the PDF document or feel free to contact us.

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