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Observing the conductive particles from the planar direction and the cross-sectional direction! A case study confirming the degree of deformation.

For more details, please refer to the PDF document or feel free to contact us.

Support for the difficulties in the development and evaluation of components, devices, and materials related to semiconductor products.

We provide a total solution from sample preparation of a series of processes for semiconductor products to reliability evaluation tests and failure analysis. You can utilize the necessary services as much as you need. A total solution means we support you from sample preparation to evaluation and analysis, addressing the difficulties in developing and evaluating components, devices, and materials related to semiconductor products (such as when evaluation samples cannot be prepared, evaluation methods are unclear, or there is no prior data). 【Sample Preparation】 ● Wafer Process ■ Arrangement of general-purpose TEG ■ Dicing ■ Chip sorting ■ Visual inspection ■ Packaging (chip trays, embossed taping) ● Packaging Process ■ Die bonding ■ Wire bonding ■ Flip chip mounting ■ Bump bonding ■ Package assembly

Some overseas manufactured parts and products may have quality issues. We provide quality evaluation services for reliability testing and assessment for these.

■Reliability Testing ・Temperature Cycle Test ・Cold Heat Shock Test ・High Temperature High Humidity Bias Test ・High Temperature Storage Test ・Highly Accelerated Life Test ・Preconditioning ・Hot Oil Test ・In-situ Continuous Measurement ・Ion Migration Test ・Electromigration Test ■Evaluation Testing ・Bond Strength Test 　Pull/Shear Test ・Mechanical Strength Test 　Vibration/Shock Test, Drop Test, Compressive Strength/Shear Strength ・ESD/Latch Up/CDM Test ・Solder Wetting Test ・Electrical Characteristic Measurement ・Salt Spray Test ・X-ray Transmission Observation ・SAT (Ultrasonic Microscope) Observation

Check the quality status of LCD components and products! We will analyze the structures of the LCD panels using our analytical methods and expertise!

【Analysis Content (Excerpt)】 <Optical Observation> ■Classification ・Panel LCM/Cell ・Optical observation after cell disassembly ■Evaluation Items ・COG bonding/FOG bonding ・SEG-LCD_PIN bonding ・Lead wiring/peripheral circuits ・Cell seal ・Display section ・TFT/CF structure ■Analysis Method ・OM observation *For more details, please refer to the PDF document or feel free to contact us.

We will narrow down the defective areas through lighting confirmation, panel disassembly, and optical microscope observation!

【Target Panels】 ■Segment LCD ■Passive LCD ■Active TFT LCD (automotive, mobile, TV, etc.) 【Items to Prepare】 ■Defective panel ■Lighting fixture (panel display defect photos are also acceptable) ■Reference panel (if available) *For more details, please refer to the PDF document or feel free to contact us.

We can perform good product characteristic measurements for performance verification, as well as defective characteristic measurements and reliability evaluations!

【Other Features】 <DC Bias Stress Test> ■ Apply an arbitrary DC bias to the Gate and Drain, measure the Vth shift when stress is applied to the TFT, and confirm reliability. ■ Can be measured even in a heated state as an accelerated test. ■ By conducting measurements with multiple panel manufacturers and comparing the Vth shift amounts, superiority judgments can also be made. *For more details, please refer to the PDF document or feel free to contact us.

If you're having trouble with LCD analysis, we at ITES are here to help you find a solution!

For more details, please refer to the PDF document or feel free to contact us.

Rich equipment and expertise! We will elucidate the molecular structures of materials in general through chemical instrument analysis!

【Equipment Used】 ■FT-IR Device ■XPS (ESCA) Device ■GC-MS Device *For more details, please refer to the PDF document or feel free to contact us.

We propose analytical methods tailored to materials and purposes! Here are examples of chemical analysis for each component, such as liquid crystals and sealing materials.

【Other Examples of Chemical Analysis (Partial)】 < Liquid Crystals > ■ GCMS: Analysis of Liquid Crystal Components ■ ICP-AES: Analysis of Metal Elements in Liquid Crystals ■ Results - Liquid crystal components containing cyano groups were used, and metal elements were detected in the liquid crystal. - The polarization of the cyano group may interact with metals and affect liquid crystal driving. < Polarizers > ■ HS-GCMS: Outgassing Analysis (Degradation Analysis) ■ Results - In samples subjected to constant temperature and humidity tests, hydrolysis of cellulose acetate due to the degradation of the polarizer was confirmed. - Hydrolysis of the polarizer is one of the causes of panel display defects. *For more details, please refer to the PDF document or feel free to contact us.

The observation target is an IC chip connected to the LCD panel using the COG mounting method! The circuit surface was clearly visible.

【Other Overview】 <IC Chip of the LCD Panel> ■ The subject of observation is the IC chip connected to the LCD panel using the COG mounting method. ■ The IC chip is bonded to the glass substrate with ACF, and the structure does not allow for the removal of the IC chip. ■ An attempt was made to observe the circuit side of the IC chip through the glass substrate, but it was obstructed by the wiring on the glass substrate and conductive particles, making it impossible to confirm the circuit side of the IC chip. *For more details, please refer to the PDF document or feel free to contact us.

Numerous achievements in defect analysis! Detailed analysis is possible, from confirming phenomena to hypothesizing the mechanisms of defect occurrence.

【Occurrence of defects in such panels】 ■ Segment Panel 　・Missing segment display 　・Partial missing segment display 　・Overall dim display ■ TFT LCD Panel 　・Bright lines/Dark lines 　・Bright spots/Dark spots 　・Unevenness 　・Abnormal heating 　・Appearance damage *For more details, please refer to the PDF document or feel free to contact us.

If any issues arise, detailed analysis will also be provided! A simplified analysis for customers considering the introduction of overseas LCDs.

【Observation Content of Cell Disassembly Observation】 ■ Confirmation of the condition of the sealing material and PI film ■ Check for shape abnormalities, corrosion, or foreign substances in the pixel area TFT *For more details, please refer to the PDF document or feel free to contact us.