Aites Device List

This is a list of devices used for analysis, evaluation, and testing services at AITES.

Aites is a solution-oriented company that sincerely addresses customer challenges in cutting-edge industrial fields. We utilize various owned devices to provide optimal solutions. ■ Product Analysis / Defect Analysis / Failure Analysis Morphological observation, electrical characteristic measurement, defect analysis, failure analysis, sample processing ■ Reliability Evaluation Testing Reliability evaluation testing, ESD/latch-up testing, strength testing, optical characteristics ■ Physical Analysis / Chemical Analysis Physical analysis, surface analysis, chemical analysis

List of Devices

basic information

■Morphological Observation 　・Laser Microscope 　・SAM/SAT 　・X-ray Fluoroscopy Device 　・SEM/FE-SEM ■Electrical Characteristic Measurement 　・Curve Tracer 　・Power Device Analyzer ■Failure Analysis 　・EMS/IR-OBIRCH 　・EBIC ■Sample Processing 　・FIB 　・Rotary Polishing Table 　・Ion Polisher 　・Oblique Cutting Device ■Reliability Evaluation Testing 　・Liquid Chamber/Gas Chamber Thermal Shock Test Device 　・Constant Temperature and Humidity Chamber/Bias Test 　・Constant Temperature Chamber 　・HAST/PCT/PCBT 　・In-Situ Continuous Measurement Device ■ESD/Latch-Up Testing 　・ESD Tester (HBM/MM/CDM/Latch-Up) ■Optical Properties 　・Total Flux/Light Intensity Measurement System ■Physical Analysis 　・SEM+EDX/EPMA 　・FE-TEM+EDS/EELS 　・STEM+EDS ■Surface Analysis 　・AES 　・XPS 　・μFT-IR 　・AFM ■Chemical Analysis 　・GC-MS (HS/Thermal Decomposition) 　・LC-MS 　・Microscopic Raman Spectrometer

Price information

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Delivery Time

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It varies depending on the case (there is a setting for urgent response).

Applications/Examples of results

Analysis and Evaluation of Electronic Components - Contract Services ■ Physical Analysis / Surface Analysis / Chemical Analysis ■ Product Analysis / Defect Analysis / Failure Analysis ■ Reliability Testing / ESD / Latch-Up Testing / Characteristic Evaluation

OTHER

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News about this product（1）

Reverse bias test of power devices (up to 2000V)
- Product news
At Aites Co., Ltd., high-temperature reverse bias testing (HTRB) for evaluating the oxide film and junction of power devices can be applied up to a maximum of 2000V. By monitoring the leakage current during the test, the degradation status of the device can be grasped in real-time. Since the power supply is independent, if one device fails during the test, it will not affect the other devices. Additionally, it is possible to set a failure criterion (current value) and to cut off the power supply to the device deemed faulty at the time of failure judgment. 【Specifications and Service Details】 ■ Test Voltage: Up to a maximum of DC 2000V ■ Applied Current: Up to a maximum of 14mA ■ Number of Test Devices: Up to a maximum of 8 (independent power supply) ■ Compatible Modules: TO-247, TO-220, etc. (other packages require consultation regarding connection methods) ■ Measurement Content: Monitoring of leakage current ■ Temperature Range: Up to a maximum of 200°C (85°C/85% in high temperature and high humidity conditions)

Apr 10, 2023

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Distributors

アイテス

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

Product/Service List (353)