Aites Device List
This is a list of devices used for analysis, evaluation, and testing services at AITES.
Aites is a solution-oriented company that sincerely addresses customer challenges in cutting-edge industrial fields. We utilize various owned devices to provide optimal solutions. ■ Product Analysis / Defect Analysis / Failure Analysis Morphological observation, electrical characteristic measurement, defect analysis, failure analysis, sample processing ■ Reliability Evaluation Testing Reliability evaluation testing, ESD/latch-up testing, strength testing, optical characteristics ■ Physical Analysis / Chemical Analysis Physical analysis, surface analysis, chemical analysis
basic information
■Morphological Observation ・Laser Microscope ・SAM/SAT ・X-ray Fluoroscopy Device ・SEM/FE-SEM ■Electrical Characteristic Measurement ・Curve Tracer ・Power Device Analyzer ■Failure Analysis ・EMS/IR-OBIRCH ・EBIC ■Sample Processing ・FIB ・Rotary Polishing Table ・Ion Polisher ・Oblique Cutting Device ■Reliability Evaluation Testing ・Liquid Chamber/Gas Chamber Thermal Shock Test Device ・Constant Temperature and Humidity Chamber/Bias Test ・Constant Temperature Chamber ・HAST/PCT/PCBT ・In-Situ Continuous Measurement Device ■ESD/Latch-Up Testing ・ESD Tester (HBM/MM/CDM/Latch-Up) ■Optical Properties ・Total Flux/Light Intensity Measurement System ■Physical Analysis ・SEM+EDX/EPMA ・FE-TEM+EDS/EELS ・STEM+EDS ■Surface Analysis ・AES ・XPS ・μFT-IR ・AFM ■Chemical Analysis ・GC-MS (HS/Thermal Decomposition) ・LC-MS ・Microscopic Raman Spectrometer
Price information
We will provide individual estimates based on the details of your inquiry.
Delivery Time
Applications/Examples of results
Analysis and Evaluation of Electronic Components - Contract Services ■ Physical Analysis / Surface Analysis / Chemical Analysis ■ Product Analysis / Defect Analysis / Failure Analysis ■ Reliability Testing / ESD / Latch-Up Testing / Characteristic Evaluation
