ESD (CDM) Testing Contract Services
We offer testing services to evaluate the resistance of the Charged Device Model (CDM) to ESD.
■ We will support each standard waveform for JEDEC, JEITA (EIAJ), and AEC through unit replacement. ■ We support both Direct Charge Method (Direct CDM) and Field Induced Method (Field Induced CDM). ■ The contact state confirmation function of the applied pins ensures reliable application. ■ Destruction judgment support is also possible using the diode characteristic judgment method (consultation required).
basic information
■Applied voltage from 0V to ±4000V, in 5V steps ■Supports up to a maximum of 1024 pins. ■Probe movement accuracy: 0.1mm ■Applied unit: JEDEC (JESD22-C101F), JEITA, EIAJ, AEC ■Charging method FI-CDM: Field Induced Method (JEDEC, AEC) D-CDM: Direct Charge Method (JEITA, EIAJ, AEC) ☆Started testing services for automotive electronic component standard: AEC-Q100-011 Capable of supporting AEC standard Field Induced CDM (FI-CDM) testing. Capable of supporting AEC standard Direct CDM (D-CDM) testing.
Price information
We will provide a quotation based on the examination conditions.
Delivery Time
Applications/Examples of results
JEDEC JEITA EIAJ AEC Various standard tests
