• Surface and chemical analysis

Moisture and heat resistance test for adhesive

アイテス

• Surface and chemical analysis

State analysis of cathode active materials using XPS.

アイテス

• Defects and Physical Analysis

Example of failure analysis of chip resistors

アイテス

• Surface and chemical analysis

Evaluation of the rebound and vibration absorption properties of rubber materials

アイテス

• Defects and Physical Analysis

Specification verification and failure analysis through reliability testing.

アイテス

• Surface and chemical analysis

Dynamic viscoelasticity measurement of CFRP

アイテス

• Surface and chemical analysis

X-ray CT analysis and EDX analysis of capsule powder.

アイテス

• Processing observation

Effects of heat generated during cross-section ion milling (CP) processing.

アイテス

• Defects and Physical Analysis

Announcement of the introduction of Talos F200E

アイテス

• Surface and chemical analysis

Poisson's ratio measurement

アイテス

• Processing observation

Observation of thermal deformation using a 3D shape measurement device (VR-6200)

アイテス

• Processing observation

Cryogenic ion milling cross-section processing example (rubber products)

アイテス

• Surface and chemical analysis

Evaluation of tensile properties using a extensometer compatible with high-stretch flexible materials.

アイテス

• Processing observation

About the curing temperature of epoxy resin free from hazardous substances.

アイテス

• Surface and chemical analysis

Rubber heat aging test

アイテス

• Surface and chemical analysis

Component analysis of organic substances (FT-IR and GC/MS)

アイテス

• Processing observation

Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

アイテス

• Processing observation

Observation of tracking camera cross-section by mechanical polishing.

アイテス

• Surface and chemical analysis

NMR analysis of liquid crystal compounds

アイテス

• Processing observation

Appearance observation and measurement services

アイテス

• Processing observation

Observation of CMOS image sensor cross-section by mechanical polishing.

アイテス

• Surface and chemical analysis

Strain measurement of power module package resin.

アイテス

• Processing observation

Evaluation of various implementation substrates

アイテス

• Defects and Physical Analysis

SiC potential defect expansion inspection device

アイテス

• Surface and chemical analysis

Analysis of organic-inorganic composites using FT-IR and EDX.

アイテス

• Surface and chemical analysis

Composition analysis of LIB cathode active materials by ICP luminescence analysis.

アイテス

• Defects and Physical Analysis

Power device failure location / Slice & View three-dimensional reconstruction

アイテス

• Surface and chemical analysis

Optical film light transmission characteristics

アイテス

• Reliability test

In-chamber photography during constant temperature and humidity testing.

アイテス

• Processing observation

Example of analysis of compounds at the SAC solder and Ni pad interface.

アイテス

• Surface and chemical analysis

Measurement of moisture absorption distortion

アイテス

• Surface and chemical analysis

Micro FT-IR imaging measurement

アイテス

• Processing observation

CP processing device Arblade5000_wide area cross-section milling

アイテス

• Reliability test

IOL testing of discrete semiconductors

アイテス

• Processing observation

Observation of metallic tissue through chemical treatment.

アイテス

• Surface and chemical analysis

Micro FT-IR

アイテス

• Processing observation

Examples of semiconductor observation through mechanical polishing.

アイテス

• Surface and chemical analysis

Strain measurement in thermal shock testing

アイテス

• Surface and chemical analysis

Evaluation of particle size of positive electrode active material

アイテス

• Processing observation

Cross-sectional observation of substrate-mounted components (1) to (6)

アイテス

• Processing observation

Cross-sectional observation of substrate-mounted components.

アイテス

• Surface and chemical analysis

Chemical Analysis Trust Service

アイテス

• Defects and Physical Analysis

FPD Evaluation and Verification

アイテス

• Defects and Physical Analysis

Observation of Conductive Particle Shapes in COG Implementation

アイテス

• Defects and Physical Analysis

Analysis case of faulty switch contacts

アイテス

• Surface and chemical analysis

Raman UV-curable resin

アイテス

• Surface and chemical analysis

Evaluation of pore distribution in non-woven fabric sheets

アイテス

• Surface and chemical analysis

Dynamic SIMS

アイテス

• Surface and chemical analysis

Tensile test

アイテス

• Surface and chemical analysis

Derivatization for GC/MS analysis

アイテス