EL/PL Imaging Device PVX1000+POPLI-Octa
The wafers in the solar cell manufacturing process can be evaluated using photoluminescence.
The PVX1000+POPLI-Octa can evaluate wafers during the solar cell manufacturing process using photoluminescence. It is capable of assessing the passivation effects of the PN junction layer after thermal diffusion, the AR layer deposition, surface contamination, as well as the protective effects of the rear insulation layer and the evaluation of Local-BSF. Additionally, by using a DC power supply for EL observation of the module, it is possible to pinpoint the locations of defects. By applying reverse bias to the module and observing LEAK points, defects that have caused PID can be easily identified.
basic information
Product Features 1. Silicon wafers (6 inches square or smaller) 2. Ultra-high sensitivity cooled CCD camera (1 million pixels, -70°C) 3. Bulk imaging measurement possible with surface light source 4. Equipped with high-function image processing software 5. Desktop type for space-saving
Price range
Delivery Time
Model number/Brand name
PVX1000+POPLI-Octa
Applications/Examples of results
We can conduct a demo using customer samples. We also accept customization based on individual requests. Please feel free to contact us here.
