Microscopic EL/PL imaging device PVX1000+POPLI-μ
Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.
The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess the damage to the passivation layer around the laser contact holes. Additionally, defect location identification is possible through EL observation of the module using a DC power supply.
basic information
Product Features 1. Silicon wafers (6 inches square or smaller) 2. Ultra-high sensitivity cooled CCD camera (1 million pixels, -70°C) 3. Bulk imaging measurement within the field of view enabled by a planar laser light source 4. Equipped with high-function image processing software 5. Integrated dedicated high-shielding dark box
Price range
Delivery Time
Model number/Brand name
PVX1000+POPLI-μ
Applications/Examples of results
We can conduct a demo using customer samples. We also accept customizations based on individual requests. Please feel free to contact us here.
