[Data] Ion Migration Evaluation Test
We are publishing an overview of ion migration evaluation and the details of the testing conducted!
One of the reliability evaluation methods, the ion migration evaluation test, has become increasingly important as a pre-evaluation due to the transition of products towards being lighter, shorter, and smaller. This document presents an overview of ion migration evaluation and the details of the test implementation using an example of an evaluation test conducted at our company. We will also introduce the usefulness of the continuous measurement (In-Situ) equipment used in the evaluation tests. [Contents] ■ Introduction ■ Ion Migration ■ Ion Migration Evaluation Test ■ Evaluation Method ■ Evaluation Test Case ■ Conclusion ■ References *For more details, please refer to the PDF document or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.