X-ray fluoroscopy and CT examination device: Observation case of chip resistors
CT observation is effective for analysis as it allows for three-dimensional observation! Here, we will introduce examples of observing chip resistors.
We will introduce a case study of observing chip resistors using X-ray fluoroscopy and CT scanning. Chip resistors have a structure where a thin film of metal (the resistive element) is formed on the surface of ceramics. The L-shaped lines seen in the X-ray image are trimming marks applied to adjust the resistance value. CT observation allows for viewing the desired cross-sectional images and enables three-dimensional observation, making it effective for analysis. If any defects are found through X-ray or CT observation, cross-sectional observation and elemental analysis will be conducted to investigate the cause. [Case Study of Chip Resistor Observation] ■ CT Observation - It is possible to view the desired cross-sectional images. - Effective for analysis due to the ability to observe in three dimensions. *For more details, please refer to the PDF document or feel free to contact us.
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【Usage】 ■ X-ray fluoroscopy and CT examination equipment *For more details, please refer to the PDF document or feel free to contact us.
