Microscopic EL/PL imaging device PVX1000+POPLI-μ
Microscopic PL observation of the fine structure of wafers in the solar cell manufacturing process.
The PVX1000+POPLI-μ allows for photoluminescence observation of the fine structure of wafers during the solar cell manufacturing process using a microscope. In the case of PERC, it is possible to evaluate individual Local-BSFs based on PL intensity and assess damage to the passivation layer around laser contact holes. Additionally, defect location identification is possible through EL observation of modules using a DC power supply.
basic information
Product Features 1. Silicon wafers (6 inches square or smaller) 2. Ultra-high sensitivity cooled CCD camera (1 million pixels, -70°C) 3. Bulk imaging measurement within the field of view enabled by a planar laser light source 4. Equipped with high-function image processing software 5. Integrated dedicated high-shielding dark box
Price information
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Delivery Time
Model number/Brand name
PVX1000+POPLI-μ
Applications/Examples of results
We can conduct a demo using customer samples. We also accept customization based on individual requests. Please feel free to contact us here.
