Solar Cell EL Image Measurement Device PVX330
Industry standard that vividly reveals potential defects in solar cells, EL image inspection device PVX330.
basic information
The "PVX series" device for detecting potential defects in solar cells has been enhanced with the addition of the high-performance, low-cost model PVX330. While emphasizing the basic functions as an EL image measurement device, it is equipped with a high-resolution 24-megapixel camera in the optical system and features the industry's first autofocus function, allowing for easy operation and the acquisition of clear EL images. This can be utilized for identifying micro-cracks and defective electrode areas, as well as sorting out defective cells in modules. In thin-film solar cells, it is capable of detecting and locating film formation defects and issues with scribed electrodes.
Price information
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Delivery Time
Model number/Brand name
Aites PVX330
Applications/Examples of results
Proven track record with compound solar cells such as single crystal, polycrystalline, thin-film silicon, and CIGS. Usage examples: - Sampling inspection in mass production processes - Incorporated as a detection unit in inline inspection processes - Identifying defect locations prior to failure analysis in the development department - Measurements before and after environmental testing in reliability evaluation
