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Micro FT-IR

This year, we are introducing new additions! We will introduce the features of the three basic measurement methods.

There are three main measurement methods for "microscopic FT-IR": "transmission method," "reflection method," and "ATR method." In "microscopic FT-IR," which combines FT-IR with an optical microscope, it is possible to measure small substances on the order of several tens of micrometers that are difficult to measure with conventional FT-IR, using an aperture (field stop). While the transmission method is the basic measurement method in microscopic FT-IR measurements, the reflection method or ATR method may be more suitable depending on the shape of the sample and the feasibility of sampling. 【Characteristics of Measurement Methods】 ■ Transmission Method - Infrared light is irradiated onto the sample, and the transmitted light is measured. - Information is obtained from the thickness of the material that the infrared light has passed through. ■ Reflection Method - Infrared light is irradiated onto the sample, and the reflected light is measured. - Information is obtained from the surface of the sample. *For more details, please download the PDF or feel free to contact us.

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basic information

【Features of Other Measurement Methods】 ■ATR Method - Infrared light is irradiated onto the sample through a crystal, and the light that slightly penetrates the sample at the crystal interface is measured. - Information from a sample surface layer of about a few micrometers is obtained. *For more details, please download the PDF or feel free to contact us.

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For more details, please download the PDF or feel free to contact us.

Liquid foreign substance sampling technique for FT-IR analysis

TECHNICAL

[Data] FT-IR Analysis of Transparent Resin

OTHER

[Data] IR Analysis of Vinyl Polymers (Resin Materials)

PRODUCT

FT-IR analysis of ABS resin

PRODUCT

Comparison of Infrared Spectroscopy and Raman Spectroscopy

OTHER

Analysis of organic-inorganic composites using FT-IR and EDX.

OTHER

Component analysis of organic matter (FT-IR and GC/MS)

OTHER

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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.