アイテス Official site

Contact Us

IOL testing of discrete semiconductors

キャプチャ.JPG

IOL testing of discrete semiconductors

キャプチャ.JPG
キャプチャ.JPG

Supports IOL tests and power cycle tests for small discrete semiconductors!

We would like to introduce the "IOL testing of discrete semiconductors" that we conduct. Under normal temperature conditions, we repeatedly turn the power ON/OFF, applying stress to the device due to temperature changes caused by the device's own heat generation during power ON. During the power OFF (cooling) phase, forced cooling is also performed using a fan. 【Adjustment Conditions】 ■ Temperature Rise: 125℃ ■ Heating Time: 5 minutes ■ Cooling Time: 5 minutes ■ Fan Operating Time: 2 minutes *For more details, please download the PDF or feel free to contact us.

Related Link - https://www.ites.co.jp/

basic information

For more details, please download the PDF or feel free to contact us.

Price range

Delivery Time

Applications/Examples of results

For more details, please download the PDF or feel free to contact us.

catalog（8）

Download All Catalogs

Total Support Service for Reliability

OTHER

Contact this catalog

Total solution service for power devices

PRODUCT

Contact this catalog

Power semiconductor analysis service

PRODUCT

Contact this catalog

Power cycle testing and characteristic evaluation

PRODUCT

Contact this catalog

Total solutions for the reliability of semiconductor products.

PRODUCT

Contact this catalog

In-Situ Continuous Measurement Reliability Evaluation Testing Service

PRODUCT

Contact this catalog

IOL testing of discrete semiconductors

OTHER

Contact this catalog

Specification verification and failure analysis through reliability testing.

TECHNICAL

Contact this catalog

News about this product（1）

Recommended products

  • Surface and chemical analysis

Moisture and heat resistance test for adhesive

アイテス

  • Surface and chemical analysis

State analysis of cathode active materials using XPS.

アイテス

  • Defects and Physical Analysis

Example of failure analysis of chip resistors

アイテス

  • Surface and chemical analysis

Evaluation of the rebound and vibration absorption properties of rubber materials

アイテス

  • Defects and Physical Analysis

Specification verification and failure analysis through reliability testing.

アイテス

  • Surface and chemical analysis

Dynamic viscoelasticity measurement of CFRP

アイテス

  • Surface and chemical analysis

X-ray CT analysis and EDX analysis of capsule powder.

アイテス

  • Processing observation

Effects of heat generated during cross-section ion milling (CP) processing.

アイテス

  • Defects and Physical Analysis

Announcement of the introduction of Talos F200E

アイテス

  • Surface and chemical analysis

Poisson's ratio measurement

アイテス

  • Processing observation

Observation of thermal deformation using a 3D shape measurement device (VR-6200)

アイテス

  • Processing observation

Cryogenic ion milling cross-section processing example (rubber products)

アイテス

  • Surface and chemical analysis

Evaluation of tensile properties using a extensometer compatible with high-stretch flexible materials.

アイテス

  • Processing observation

About the curing temperature of epoxy resin free from hazardous substances.

アイテス

  • Surface and chemical analysis

Rubber heat aging test

アイテス

  • Surface and chemical analysis

Component analysis of organic substances (FT-IR and GC/MS)

アイテス

  • Processing observation

Observation of substrate deformation using a 3D shape measuring machine (VR-6200)

アイテス

  • Processing observation

Observation of tracking camera cross-section by mechanical polishing.

アイテス

  • Surface and chemical analysis

NMR analysis of liquid crystal compounds

アイテス

  • Processing observation

Appearance observation and measurement services

アイテス

  • Processing observation

Observation of CMOS image sensor cross-section by mechanical polishing.

アイテス

  • Surface and chemical analysis

Strain measurement of power module package resin.

アイテス

  • Processing observation

Evaluation of various implementation substrates

アイテス

  • Defects and Physical Analysis

SiC potential defect expansion inspection device

アイテス

  • Surface and chemical analysis

Analysis of organic-inorganic composites using FT-IR and EDX.

アイテス

  • Surface and chemical analysis

Composition analysis of LIB cathode active materials by ICP luminescence analysis.

アイテス

  • Defects and Physical Analysis

Power device failure location / Slice & View three-dimensional reconstruction

アイテス

  • Surface and chemical analysis

Optical film light transmission characteristics

アイテス

  • Reliability test

In-chamber photography during constant temperature and humidity testing.

アイテス

  • Processing observation

Example of analysis of compounds at the SAC solder and Ni pad interface.

アイテス

  • Surface and chemical analysis

Measurement of moisture absorption distortion

アイテス

  • Surface and chemical analysis

Micro FT-IR imaging measurement

アイテス

  • Processing observation

CP processing device Arblade5000_wide area cross-section milling

アイテス

  • Reliability test

IOL testing of discrete semiconductors

アイテス

  • Processing observation

Observation of metallic tissue through chemical treatment.

アイテス

  • Surface and chemical analysis

Micro FT-IR

アイテス

  • Processing observation

Examples of semiconductor observation through mechanical polishing.

アイテス

  • Surface and chemical analysis

Strain measurement in thermal shock testing

アイテス

  • Surface and chemical analysis

Evaluation of particle size of positive electrode active material

アイテス

  • Processing observation

Cross-sectional observation of substrate-mounted components (1) to (6)

アイテス

  • Processing observation

Cross-sectional observation of substrate-mounted components.

アイテス

  • Surface and chemical analysis

Chemical Analysis Trust Service

アイテス

  • Defects and Physical Analysis

FPD Evaluation and Verification

アイテス

  • Defects and Physical Analysis

Observation of Conductive Particle Shapes in COG Implementation

アイテス

  • Defects and Physical Analysis

Analysis case of faulty switch contacts

アイテス

  • Surface and chemical analysis

Raman UV-curable resin

アイテス

  • Surface and chemical analysis

Evaluation of pore distribution in non-woven fabric sheets

アイテス

  • Surface and chemical analysis

Dynamic SIMS

アイテス

  • Surface and chemical analysis

Tensile test

アイテス

  • Surface and chemical analysis

Derivatization for GC/MS analysis

アイテス

Distributors

アイテス
アイテス
Official site
Phone number/address

Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.

Product/Service List (353)