Specification verification and failure analysis through reliability testing.
Analysis can be performed on samples in various conditions thanks to our unique preprocessing technology!
Our company conducts consistent analysis from reliability testing to failure analysis. This allows us to confirm whether the samples meet the specifications, as well as to identify and observe the defective areas of failed samples. We propose and implement tests and analyses tailored to our customers' requests and objectives, assisting from cause investigation to problem resolution. Please feel free to contact us when you need our services. 【Analysis Flow】 ■ Specification confirmation of semiconductor devices through reliability testing ■ Identification of defective areas and observation of failure points using TEM ・ Identification of defective areas through EMS/OBIRCH analysis ・ Observation of failure points using TEM *For more details, please download the PDF or feel free to contact us.
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We will exhibit at the Powder Industry Exhibition "Osaka 2013"!!!
POWTEX OSAKA 2013 We will be exhibiting at the Powder Industry Exhibition 'Osaka 2013'!!! Dates: October 9, 2013 - October 11, 2013, 10:00 AM - 5:00 PM Venue: Intex Osaka (Nanko) Halls 1 & 2 Booth Number: No. 2-42 Exhibition Contents * Low-cost Conveying Device: [Blue Impact BI Series] Patented, Design Registered A cost-effective conveying device without bridges, with numerous delivery records in the battery field. * Aeration Hopper: Patented This hopper can discharge difficult powders without bridges or rat holes, making it ideal for battery materials. * Wet Collector: Patented A dust collector capable of simultaneously sucking in water vapor and powders, with many achievements in the semiconductor field. * Drum Can Inversion Suction System: PAT.P Ideal for extracting hygroscopic powders, powders that ignite when humid, and powders that should not be exposed to oxygen from drum cans. * Others: We will propose labor-saving solutions themed around 'Automatic Suction Conveying and Feeding Systems' for paper bags, drum cans (containers), and FIBC bags. We look forward to your visit.
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We will be exhibiting at the Powder & Bulk Solids Tokyo 2012!!!
We will be exhibiting at the International Powder Technology Exhibition Tokyo 2012, POWTEX TOKYO 2012. Booth No: KO1 Exhibits: 1. New Product: Powerful Swirling Flow Conveying - 'Tornado Conveying System' PAT.D Patent obtained for "Method and device for suction powder transportation using spiral airflow." 2. Drum Inversion Suction System Awarded the "Kanagawa Industrial Technology Development Award 2009 - Earth Environment Technology Award." This device can completely discharge powder packaged in polyethylene bags inside a drum without any alteration. It can be automated, making it ideal for handling hazardous powders (toxic, powder explosion) and powders that should not absorb moisture. It allows handling in dry air and N2 (nitrogen gas) environments. Adoption examples: Pharmaceuticals, medical device raw materials, battery materials, abrasives, etc. 3. Continuous and Intermittent Conveying Devices - There is no return from the nozzle due to continuous suction. - Stable conveying can be achieved in dry air and N2 environments. 4. Weighing Machine with Volumetric Feeder - Incremental, Decremental, Loss-in Type - This device can handle difficult powders that cause bridging and rat holes without issues, enabling stable cutting. A series compliant with 'GMP' has been commercialized.
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Specification verification and failure analysis through reliability testing.
Our company conducts consistent analysis from reliability testing to failure analysis. This allows us to confirm whether the samples meet the specifications, as well as to identify and observe the defective areas of failed samples. We propose and implement tests and analyses tailored to our customers' requests and objectives, assisting from cause investigation to problem resolution. Please feel free to contact us when you need our services. 【Analysis Flow】 ■ Specification confirmation of semiconductor devices through reliability testing ■ Identification of defective areas and observation of failure locations using TEM ・ Identification of defective areas through EMS/OBIRCH analysis ・ Observation of failure locations using TEM
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.