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Characteristic evaluation using a power device analyzer.

Characteristic evaluation using a power device analyzer! A device that combines the functions of a semiconductor parameter analyzer and the measurement range of a curve tracer.

Our company conducts "characteristic evaluation using a power device analyzer." The 'B1505A' is a power device analyzer/curve tracer equipped with a module capable of outputting 3000V of voltage and 1500A of current. This product combines the functions of a semiconductor parameter analyzer with the measurement and output range of a curve tracer, accommodating a wide range from small components to power devices. 【Features】 ■ Equipped with a module capable of outputting 3000V of voltage and 1500A of current ■ Possesses the functions of a semiconductor parameter analyzer and the measurement/output range of a curve tracer ■ Compatible with small components to power devices *For more details, please download the PDF or feel free to contact us.

Related Link - https://www.ites.co.jp

basic information

【Specifications (Partial)】 ■ High Power Source/Monitor Unit (HPSMU) [2 units] ■ High Current Source/Monitor Unit (HCSMU) [1 unit] ■ High Voltage Source/Monitor Unit (HVSMU) [1 unit] ■ High Current Fixture (UHC) [1 unit] *For more details, please download the PDF or feel free to contact us.

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Applications/Examples of results

In reliability testing of semiconductor devices and various electronic components, it is necessary to evaluate test samples, and measuring electrical characteristics is a fundamental evaluation method. 【Applications】 ■ Diode I-V ■ MOSFET VGSS, ID, IDSS, IGSS ■ IGBT ICES, IGES, VGES, VCE *For more details, please download the PDF or feel free to contact us.

catalog(12)

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Characteristic evaluation using a power device analyzer.

TECHNICAL

In-Situ Continuous Measurement Reliability Evaluation Testing Service

PRODUCT

Total solution service for power devices

OTHER

Total support service for LED.

PRODUCT

Introduction to Reliability Assurance Services

PRODUCT

Total Support Service for Reliability

OTHER

Power cycle testing and characteristic evaluation

PRODUCT

Module prototyping and thermal resistance evaluation

PRODUCT

Reverse bias test of power devices (up to 2000V)

PRODUCT

IOL testing of discrete semiconductors

OTHER

Specification verification and failure analysis through reliability testing.

TECHNICAL

Reliability evaluation and failure analysis of joints through power cycle testing.

TECHNICAL

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Distributors

Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.