Discrete Ultra-Fast Tester 'NANOPARSET' │ itec
Supports discrete semiconductors with 6 or 12 terminals! Modular parameter test system.
"NANOPARSET" is a parameter test system capable of testing up to 92,000 devices per hour due to its ultra-fast test times. It achieves market-leading class test cells. By integrating up to four test heads into one, it can test 24-pin packages with top-class throughput. Additionally, it performs high-speed Kelvin checks without switching relays, preventing damage. It occupies minimal installation space and can be used as a wafer tester, PCM tester, or backend final tester. [Features] ■ Improved UPH due to ultra-fast test times ■ Damage prevention with high-speed Kelvin checks without relays ■ Minimal installation space *For more details, please download the PDF or feel free to contact us.
basic information
【Specifications】 ■ Nearly zero installation area (213 x 440 mm) ■ Market-leading accuracy ■ One booster controller (nTHBC) ■ Up to 4 test heads (nSBTH), 6 channels ■ High-speed Kelvin check without switching relays ■ Ultra-fast leak testing ■ Pin electronics ■ Multi-site testing *For more details, please download the PDF or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Applications and Examples of Achievements】 ■ Control of multiple test cells ■ Backend final testing ■ Post-processing ■ Wafer testing ■ Dynamic component average testing ■ PCM testing ■ Static component average testing *For more details, please download the PDF or feel free to contact us.
catalog（1）
Download All Catalogs
Recommended products
Distributors
Our company handles semiconductor manufacturing equipment, food-related equipment, automotive-related equipment, high-security equipment, terahertz equipment, and plant-related equipment. We continue to contribute to the creation of a healthy and safe society by importing things that did not exist in the world or things that we thought would be nice to have from excellent suppliers around the globe.