Analysis of good quality overseas manufactured LCD displays

If any issues arise, detailed analysis will also be provided! A simplified analysis for customers considering the introduction of overseas LCDs.

last updated Jun 26, 2025

Case study of failure analysis of oxide-based all-solid-state batteries.

It has high safety and can be used in various environments! Consistent analysis is possible.

last updated Jul 01, 2026

Analysis case of faulty switch contacts

Appearance inspection, electrical inspection, and internal observation using X-rays conducted! Introduction of analysis cases.

last updated Jun 26, 2025

FPD Evaluation and Verification

Evaluate whether there are any potential issues related to characteristics or structure! We propose reliability testing methods and conditions.

last updated Jun 26, 2025

Observation of Conductive Particle Shapes in COG Implementation

Observing the conductive particles from the planar direction and the cross-sectional direction! A case study confirming the degree of deformation.

last updated Jun 26, 2025

Power device failure location / Slice & View three-dimensional reconstruction

By reconstructing a three-dimensional image of the damaged area, observe the overall structure of the destroyed object!

last updated Jun 26, 2025

SiC potential defect expansion inspection device

Reproducing bipolar degradation through UV laser irradiation! Sample evaluation that normally takes 2 months can be completed in 2 days.

last updated Apr 28, 2026

Announcement of the introduction of Talos F200E

Improved resolution for TEM and STEM! Performance significantly enhanced with the capability for EDS analysis using four detectors.

last updated Mar 27, 2026

Specification verification and failure analysis through reliability testing.

Analysis can be performed on samples in various conditions thanks to our unique preprocessing technology!

last updated Jul 04, 2025

Example of failure analysis of chip resistors

We will introduce processing and observation methods using mechanical polishing, SEM, and EDX!

last updated Aug 08, 2025

TEM observation of PL emission sites in SiC.

Identification of defect locations and overall understanding by PL enables detailed observation of defect areas using TEM!

last updated Apr 15, 2026

Reliability evaluation and failure analysis of joints through power cycle testing.

We conduct contract testing using Siemens testing equipment! We can also handle the production of various necessary jigs.

last updated May 21, 2026