Processing observation

Processing observation
At Aites, we conduct cross-sectional polishing, processing, observation, and analysis.
121~126 item / All 126 items
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Observation of thermal deformation using a 3D shape measurement device (VR-6200)
By combining the VR-6200 with the heater stage, it becomes possible to visualize changes during heating.
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Effects of heat generated during cross-section ion milling (CP) processing.
We would like to present the results of our observations on the production of cross-sections of rubber products and a comparison of cross-section production methods!
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Example of failure analysis of chip resistors
We will introduce processing and observation methods using mechanical polishing, SEM, and EDX!
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Confirmation of chiplet package structure by mechanical polishing.
Cross-sectional samples were created using X-ray CT observation and mechanical polishing, and structural confirmation was conducted!
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Ultrasonic microscope observation of printed circuit boards.
Delamination inside the circuit board, which is not visible during visual inspection, can also be visualized!
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Observation of wire bonding shapes
Introduction to wire bonding and other aspects of SOP (Small Outline Package) packages!
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