Processing observation

Processing observation
At Aites, we conduct cross-sectional polishing, processing, observation, and analysis.
121~131 item / All 131 items
-

Observation of thermal deformation using a 3D shape measurement device (VR-6200)
By combining the VR-6200 with the heater stage, it becomes possible to visualize changes during heating.
last updated
-

Effects of heat generated during cross-section ion milling (CP) processing.
We would like to present the results of our observations on the production of cross-sections of rubber products and a comparison of cross-section production methods!
last updated
-

Example of failure analysis of chip resistors
We will introduce processing and observation methods using mechanical polishing, SEM, and EDX!
last updated
-

Confirmation of chiplet package structure by mechanical polishing.
Cross-sectional samples were created using X-ray CT observation and mechanical polishing, and structural confirmation was conducted!
last updated
-

Ultrasonic microscope observation of printed circuit boards.
Delamination inside the circuit board, which is not visible during visual inspection, can also be visualized!
last updated
-

Observation of wire bonding shapes
Introduction to wire bonding and other aspects of SOP (Small Outline Package) packages!
last updated
-

[Case Study] Analysis of Non-lighting in LED Lighting
A case study of conducting elemental analysis for migration elemental analysis and identifying the source of Ag generation!
last updated
-

Surface and cross-sectional analysis after scratch testing.
Understanding the internal destruction mechanisms near the surface that cannot be discerned through surface observation alone!
last updated
-

Examples of cross-sectional observation of wire bonding with various compositions.
We propose processing, pretreatment, and observation methods based on accumulated know-how! We will introduce examples of observation and elemental analysis of various wire cross-sections.
last updated
-

Comparison of cross-sectional observation images
We will introduce suitable observation methods for cross-sectional observation of chip resistors and copper wiring sections!
last updated
-

Observation of ceramic substrates
By visualizing the crystal structure, it is possible to investigate the interrelationship between material properties and organization, as well as quality improvements aimed at enhancing material properties!
last updated