Surface and cross-sectional analysis after scratch testing.
Understanding the internal destruction mechanisms near the surface that cannot be discerned through surface observation alone!
The scratch test is a very important analytical method for identifying interfacial strength, delamination behavior, and failure modes. By conducting cross-sectional analysis, it is possible to understand the "internal failure mechanisms" near the surface that cannot be discerned through surface observation alone. The scratch test, widely used in the evaluation of coatings, resins, and adhesive layers, is essential for material development, defect analysis, and process optimization. [Surface Analysis After Scratch Testing] ■ Image processing with a scanner ■ Laser microscope *For more details, please download the PDF or feel free to contact us.
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【Cross-sectional analysis after scratch test】 ■Polarizing microscope ■SEM *For more details, please download the PDF or feel free to contact us.
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Aites was established in 1993, originating from the quality assurance department of the IBM Japan Yasu office. Based on the technical expertise cultivated through cutting-edge defect analysis and reliability assurance of electronic components at the IBM Japan Yasu office, we have provided various products and services that support the development and manufacturing of semiconductors, displays, organic EL, solar cells, and electronic components to customers both domestically and internationally.